Accelerated Addition in Resistive RAM Array Using Parallel-Friendly Majority Gates:
Saved in:
Bibliographic Details
Main Authors: Reuben, John (Author), Pechmann, Stefan (Author)
Format: Electronic eBook
Language:English
Published: Erlangen ; Nürnberg Friedrich-Alexander-Universität Erlangen-Nürnberg (FAU) 2021
Edition:Preprint
Links:https://nbn-resolving.org/urn:nbn:de:bvb:29-opus4-161464
https://d-nb.info/1231078030/34
https://open.fau.de/handle/openfau/16146
Physical Description:1 Online-Ressource