Nonlinear transistor model parameter extraction techniques:
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty...
Gespeichert in:
| Weitere beteiligte Personen: | , , |
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| Format: | E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2012
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| Schriftenreihe: | The Cambridge RF and microwave engineering series
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| Links: | https://doi.org/10.1017/CBO9781139014960 |
| Zusammenfassung: | Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. |
| Umfang: | 1 Online-Ressource (xiv, 352 Seiten) |
| ISBN: | 9781139014960 |
Internformat
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| 520 | |a Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. | ||
| 700 | 1 | |a Fager, Christian | |
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| spelling | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root Cambridge Cambridge University Press 2012 1 Online-Ressource (xiv, 352 Seiten) txt c cr The Cambridge RF and microwave engineering series Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied to different technologies. A variety of real-world industrial examples and measurement results show you how the theories and methods presented can be used in practice. Whether you use transistor models for evaluation of device processing and you need to understand the methods behind the models you use, or you want to develop models for existing and new device types, this is your complete guide to parameter extraction. Fager, Christian Root, David E. Rudolph, Matthias 1969- Erscheint auch als Druck-Ausgabe 9780521762106 |
| spellingShingle | Nonlinear transistor model parameter extraction techniques |
| title | Nonlinear transistor model parameter extraction techniques |
| title_auth | Nonlinear transistor model parameter extraction techniques |
| title_exact_search | Nonlinear transistor model parameter extraction techniques |
| title_full | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_fullStr | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_full_unstemmed | Nonlinear transistor model parameter extraction techniques edited by Matthias Rudolph, Christian Fager, David E. Root |
| title_short | Nonlinear transistor model parameter extraction techniques |
| title_sort | nonlinear transistor model parameter extraction techniques |
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