Thin film materials: stress, defect formation, and surface evolution
Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film material...
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| Format: | E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Cambridge
Cambridge University Press
2003
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| Links: | https://doi.org/10.1017/CBO9780511754715 |
| Zusammenfassung: | Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field. |
| Umfang: | 1 Online-Ressource (xviii, 750 Seiten) |
| ISBN: | 9780511754715 |
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| spelling | Freund, L. B. Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh Cambridge Cambridge University Press 2003 1 Online-Ressource (xviii, 750 Seiten) txt c cr Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field. Suresh, S. Erscheint auch als Druck-Ausgabe 9780521529778 Erscheint auch als Druck-Ausgabe 9780521822817 |
| spellingShingle | Freund, L. B. Thin film materials stress, defect formation, and surface evolution |
| title | Thin film materials stress, defect formation, and surface evolution |
| title_auth | Thin film materials stress, defect formation, and surface evolution |
| title_exact_search | Thin film materials stress, defect formation, and surface evolution |
| title_full | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_fullStr | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_full_unstemmed | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_short | Thin film materials |
| title_sort | thin film materials stress defect formation and surface evolution |
| title_sub | stress, defect formation, and surface evolution |
| work_keys_str_mv | AT freundlb thinfilmmaterialsstressdefectformationandsurfaceevolution AT sureshs thinfilmmaterialsstressdefectformationandsurfaceevolution |