Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Körperschaft: | |
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
New York,NY,United States
Association for Computing Machinery
2022
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| Schriftenreihe: | ACM Conferences
|
| Links: | https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 |
| Umfang: | 1 Online-Ressource (20 Seiten) |
| ISBN: | 9781450393874 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV048945399 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 230510m2022 xx o|||| 00||| eng d | ||
| 020 | |a 9781450393874 |9 978-1-4503-9387-4 | ||
| 035 | |a (ZDB-15-ACM)10.1145/3536168 | ||
| 035 | |a (OCoLC)1379412010 | ||
| 035 | |a (DE-599)BVBBV048945399 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-19 | ||
| 100 | 1 | |a Wang, Shuai |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| 246 | 1 | 0 | |a AISTA 2022 |
| 264 | 1 | |a New York,NY,United States |b Association for Computing Machinery |c 2022 | |
| 300 | |a 1 Online-Ressource (20 Seiten) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a ACM Conferences | |
| 710 | 2 | |a AISTA '22: 2nd ACM International Workshop on AI and Software Testing/Analysis |d 2022 |c Virtual South Korea |e Verfasser |4 aut | |
| 710 | 2 | |a Association for Computing Machinery-Digital Library |e Sonstige |4 oth | |
| 710 | 2 | |a ACM Special Interest Group on Software Engineering |e Sonstige |4 oth | |
| 710 | 2 | |a ACM SIGs |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-15-ACM | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-034209247 | |
| 966 | e | |u https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 |l DE-19 |p ZDB-15-ACM |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1818990570540892160 |
|---|---|
| any_adam_object | |
| author | Wang, Shuai |
| author_corporate | AISTA '22: 2nd ACM International Workshop on AI and Software Testing/Analysis |
| author_corporate_role | aut |
| author_facet | Wang, Shuai AISTA '22: 2nd ACM International Workshop on AI and Software Testing/Analysis |
| author_role | aut |
| author_sort | Wang, Shuai |
| author_variant | s w sw |
| building | Verbundindex |
| bvnumber | BV048945399 |
| collection | ZDB-15-ACM |
| ctrlnum | (ZDB-15-ACM)10.1145/3536168 (OCoLC)1379412010 (DE-599)BVBBV048945399 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01496nam a2200373 c 4500</leader><controlfield tag="001">BV048945399</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">230510m2022 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781450393874</subfield><subfield code="9">978-1-4503-9387-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-15-ACM)10.1145/3536168</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1379412010</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048945399</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-19</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Wang, Shuai</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis</subfield></datafield><datafield tag="246" ind1="1" ind2="0"><subfield code="a">AISTA 2022</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York,NY,United States</subfield><subfield code="b">Association for Computing Machinery</subfield><subfield code="c">2022</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (20 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">ACM Conferences</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">AISTA '22: 2nd ACM International Workshop on AI and Software Testing/Analysis</subfield><subfield code="d">2022</subfield><subfield code="c">Virtual South Korea</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Association for Computing Machinery-Digital Library</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM Special Interest Group on Software Engineering</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM SIGs</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F3536168</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-15-ACM</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034209247</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F3536168</subfield><subfield code="l">DE-19</subfield><subfield code="p">ZDB-15-ACM</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV048945399 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T19:56:28Z |
| institution | BVB |
| isbn | 9781450393874 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034209247 |
| oclc_num | 1379412010 |
| open_access_boolean | |
| owner | DE-19 DE-BY-UBM |
| owner_facet | DE-19 DE-BY-UBM |
| physical | 1 Online-Ressource (20 Seiten) |
| psigel | ZDB-15-ACM |
| publishDate | 2022 |
| publishDateSearch | 2022 |
| publishDateSort | 2022 |
| publisher | Association for Computing Machinery |
| record_format | marc |
| series2 | ACM Conferences |
| spelling | Wang, Shuai Verfasser aut Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis AISTA 2022 New York,NY,United States Association for Computing Machinery 2022 1 Online-Ressource (20 Seiten) txt rdacontent c rdamedia cr rdacarrier ACM Conferences AISTA '22: 2nd ACM International Workshop on AI and Software Testing/Analysis 2022 Virtual South Korea Verfasser aut Association for Computing Machinery-Digital Library Sonstige oth ACM Special Interest Group on Software Engineering Sonstige oth ACM SIGs Sonstige oth https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Wang, Shuai Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_alt | AISTA 2022 |
| title_auth | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_exact_search | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_full | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_fullStr | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_full_unstemmed | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_short | Proceedings of the 2nd ACM International Workshop on AI and Software Testing/Analysis |
| title_sort | proceedings of the 2nd acm international workshop on ai and software testing analysis |
| url | https://dl.acm.org/action/showBook?doi=10.1145%2F3536168 |
| work_keys_str_mv | AT wangshuai proceedingsofthe2ndacminternationalworkshoponaiandsoftwaretestinganalysis AT aista222ndacminternationalworkshoponaiandsoftwaretestinganalysis proceedingsofthe2ndacminternationalworkshoponaiandsoftwaretestinganalysis AT associationforcomputingmachinerydigitallibrary proceedingsofthe2ndacminternationalworkshoponaiandsoftwaretestinganalysis AT acmspecialinterestgrouponsoftwareengineering proceedingsofthe2ndacminternationalworkshoponaiandsoftwaretestinganalysis AT acmsigs proceedingsofthe2ndacminternationalworkshoponaiandsoftwaretestinganalysis AT wangshuai aista2022 AT aista222ndacminternationalworkshoponaiandsoftwaretestinganalysis aista2022 AT associationforcomputingmachinerydigitallibrary aista2022 AT acmspecialinterestgrouponsoftwareengineering aista2022 AT acmsigs aista2022 |