Verfügbarkeit: Recent Advances in Metrology | Technische Universität München

Recent Advances in Metrology: Select Proceedings of AdMet 2021

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Weitere beteiligte Personen:	Yadav, Sanjay (HerausgeberIn), Chaudhary, K.P (HerausgeberIn), Gahlot, Ajay (HerausgeberIn), Arya, Yogendra (HerausgeberIn), Dahiya, Aman (HerausgeberIn), Garg, Naveen (HerausgeberIn)
Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	Singapore Springer Nature Singapore 2023 Singapore Springer
Ausgabe:	1st ed. 2023
Schriftenreihe:	Lecture Notes in Electrical Engineering 906
Schlagwörter:	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
Links:	https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2 https://doi.org/10.1007/978-981-19-2468-2
Umfang:	1 Online-Ressource (XVI, 381 p. 213 illus., 147 illus. in color)
ISBN:	9789811924682
ISSN:	1876-1119
DOI:	10.1007/978-981-19-2468-2

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spellingShingle	Recent Advances in Metrology Select Proceedings of AdMet 2021 Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
title	Recent Advances in Metrology Select Proceedings of AdMet 2021
title_auth	Recent Advances in Metrology Select Proceedings of AdMet 2021
title_exact_search	Recent Advances in Metrology Select Proceedings of AdMet 2021
title_full	Recent Advances in Metrology Select Proceedings of AdMet 2021 edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg
title_fullStr	Recent Advances in Metrology Select Proceedings of AdMet 2021 edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg
title_full_unstemmed	Recent Advances in Metrology Select Proceedings of AdMet 2021 edited by Sanjay Yadav, K.P. Chaudhary, Ajay Gahlot, Yogendra Arya, Aman Dahiya, Naveen Garg
title_short	Recent Advances in Metrology
title_sort	recent advances in metrology select proceedings of admet 2021
title_sub	Select Proceedings of AdMet 2021
topic	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
topic_facet	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
url	https://doi.org/10.1007/978-981-19-2468-2
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