Applications and metrology at nanometer scale:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Hoboken
ISTE
2020-
|
Internformat
MARC
| LEADER | 00000nam a2200000 ca4500 | ||
|---|---|---|---|
| 001 | BV047386874 | ||
| 003 | DE-604 | ||
| 005 | 20210928 | ||
| 007 | t| | ||
| 008 | 210727m2020uuuuxx |||| 00||| eng d | ||
| 035 | |a (DE-599)BVBBV047386874 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 100 | 1 | |a Dahoo, Pierre-Richard |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Applications and metrology at nanometer scale |c Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| 264 | 1 | |a Hoboken |b ISTE |c 2020- | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 700 | 1 | |a Pougnet, Philippe |e Sonstige |4 oth | |
| 700 | 1 | |a El Hami, Abdelkhalak |e Sonstige |0 (DE-588)107586254X |4 oth | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-032788277 | |
Datensatz im Suchindex
| _version_ | 1818988153748324352 |
|---|---|
| any_adam_object | |
| author | Dahoo, Pierre-Richard |
| author_GND | (DE-588)107586254X |
| author_facet | Dahoo, Pierre-Richard |
| author_role | aut |
| author_sort | Dahoo, Pierre-Richard |
| author_variant | p r d prd |
| building | Verbundindex |
| bvnumber | BV047386874 |
| ctrlnum | (DE-599)BVBBV047386874 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00737nam a2200229 ca4500</leader><controlfield tag="001">BV047386874</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20210928 </controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">210727m2020uuuuxx |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047386874</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Dahoo, Pierre-Richard</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Applications and metrology at nanometer scale</subfield><subfield code="c">Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken</subfield><subfield code="b">ISTE</subfield><subfield code="c">2020-</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pougnet, Philippe</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">El Hami, Abdelkhalak</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)107586254X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032788277</subfield></datafield></record></collection> |
| id | DE-604.BV047386874 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T19:18:04Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032788277 |
| open_access_boolean | |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | ISTE |
| record_format | marc |
| spelling | Dahoo, Pierre-Richard Verfasser aut Applications and metrology at nanometer scale Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami Hoboken ISTE 2020- txt rdacontent n rdamedia nc rdacarrier Pougnet, Philippe Sonstige oth El Hami, Abdelkhalak Sonstige (DE-588)107586254X oth |
| spellingShingle | Dahoo, Pierre-Richard Applications and metrology at nanometer scale |
| title | Applications and metrology at nanometer scale |
| title_auth | Applications and metrology at nanometer scale |
| title_exact_search | Applications and metrology at nanometer scale |
| title_full | Applications and metrology at nanometer scale Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_fullStr | Applications and metrology at nanometer scale Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_full_unstemmed | Applications and metrology at nanometer scale Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_short | Applications and metrology at nanometer scale |
| title_sort | applications and metrology at nanometer scale |
| work_keys_str_mv | AT dahoopierrerichard applicationsandmetrologyatnanometerscale AT pougnetphilippe applicationsandmetrologyatnanometerscale AT elhamiabdelkhalak applicationsandmetrologyatnanometerscale |