Advanced VLSI Design and Testability Issues:
Gespeichert in:
| Weitere beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Milton
Taylor & Francis Group
2020
|
| Schlagwörter: | |
| Umfang: | XVII, 359 Seiten |
| ISBN: | 9780367492823 |
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Datensatz im Suchindex
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| id | DE-604.BV047119557 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T19:10:15Z |
| institution | BVB |
| isbn | 9780367492823 |
| language | English |
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| physical | XVII, 359 Seiten |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Taylor & Francis Group |
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| spelling | Tripathi, Suman Lata edt Advanced VLSI Design and Testability Issues Milton Taylor & Francis Group 2020 XVII, 359 Seiten txt rdacontent n rdamedia nc rdacarrier VLSI (DE-588)4117388-0 gnd rswk-swf VLSI (DE-588)4117388-0 s DE-604 Saxena, Sobhit edt Mohapatra, Sushanta Kumar edt |
| spellingShingle | Advanced VLSI Design and Testability Issues VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4117388-0 |
| title | Advanced VLSI Design and Testability Issues |
| title_auth | Advanced VLSI Design and Testability Issues |
| title_exact_search | Advanced VLSI Design and Testability Issues |
| title_full | Advanced VLSI Design and Testability Issues |
| title_fullStr | Advanced VLSI Design and Testability Issues |
| title_full_unstemmed | Advanced VLSI Design and Testability Issues |
| title_short | Advanced VLSI Design and Testability Issues |
| title_sort | advanced vlsi design and testability issues |
| topic | VLSI (DE-588)4117388-0 gnd |
| topic_facet | VLSI |
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