Verfügbarkeit: Pattern recognition and information forensics

Pattern recognition and information forensics: ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers

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Bibliographische Detailangaben
Körperschaft:	ICPR Peking (VerfasserIn)
Weitere beteiligte Personen:	Zhang, Zhaoxiang (HerausgeberIn), Suter, David (HerausgeberIn), Tian, Yingli (HerausgeberIn), Branzan Albu, Alexandra (HerausgeberIn), Sidère, Nicolas (HerausgeberIn), Jair Escalante, Hugo (HerausgeberIn)
Format:	Elektronisch Tagungsbericht E-Book
Sprache:	Englisch
Veröffentlicht:	Cham Springer [2019] Cham
Schriftenreihe:	Lecture notes in computer science 11188 : Image processing, computer vision, pattern recognition, and graphics
Schlagwörter:	Image Processing and Computer Vision Pattern Recognition Computer Graphics Computer vision Optical pattern recognition Computer graphics Mustererkennung Konferenzschrift > 2018 > Peking
Links:	https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3 https://doi.org/10.1007/978-3-030-05792-3
Umfang:	1 Online-Ressource (XXIV, 178 Seiten) Illustrationen, Diagramme
ISBN:	9783030057923
DOI:	10.1007/978-3-030-05792-3

Internformat

MARC


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genre	1\p (DE-588)1071861417 Konferenzschrift 2018 Peking gnd-content
genre_facet	Konferenzschrift 2018 Peking
id	DE-604.BV045448802
illustrated	Illustrated
indexdate	2025-01-11T19:08:47Z
institution	BVB
institution_GND	(DE-588)1176529617
isbn	9783030057923
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030834230
oclc_num	1085382075
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owner	DE-355 DE-BY-UBR DE-860 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-473 DE-BY-UBG DE-29 DE-863 DE-BY-FWS DE-20 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-703 DE-706 DE-739 DE-634
owner_facet	DE-355 DE-BY-UBR DE-860 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-859 DE-473 DE-BY-UBG DE-29 DE-863 DE-BY-FWS DE-20 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-703 DE-706 DE-739 DE-634
physical	1 Online-Ressource (XXIV, 178 Seiten) Illustrationen, Diagramme
psigel	ZDB-2-SCS ZDB-2-LNC ZDB-2-SCS_2019 ZDB-2-LNC_2019 ZDB-2-LNC ZDB-2-LNC_2019
publishDate	2019
publishDateSearch	2019
publishDateSort	2019
publisher	Springer
record_format	marc
series	Lecture notes in computer science
series2	Lecture notes in computer science Image processing, computer vision, pattern recognition, and graphics
spellingShingle	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers Lecture notes in computer science Image Processing and Computer Vision Pattern Recognition Computer Graphics Computer vision Optical pattern recognition Computer graphics Mustererkennung (DE-588)4040936-3 gnd
subject_GND	(DE-588)4040936-3 (DE-588)1071861417
title	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers
title_auth	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers
title_exact_search	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers
title_full	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers Zhaoxiang Zhang, David Suter, Yingli Tian, Alexandra Branzan Albu, Nicolas Sidère, Hugo Jair Escalante (Eds.)
title_fullStr	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers Zhaoxiang Zhang, David Suter, Yingli Tian, Alexandra Branzan Albu, Nicolas Sidère, Hugo Jair Escalante (Eds.)
title_full_unstemmed	Pattern recognition and information forensics ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers Zhaoxiang Zhang, David Suter, Yingli Tian, Alexandra Branzan Albu, Nicolas Sidère, Hugo Jair Escalante (Eds.)
title_short	Pattern recognition and information forensics
title_sort	pattern recognition and information forensics icpr 2018 international workshops cvaui iwcf and mippsna beijing china august 20 24 2018 revised selected papers
title_sub	ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018 : revised selected papers
topic	Image Processing and Computer Vision Pattern Recognition Computer Graphics Computer vision Optical pattern recognition Computer graphics Mustererkennung (DE-588)4040936-3 gnd
topic_facet	Image Processing and Computer Vision Pattern Recognition Computer Graphics Computer vision Optical pattern recognition Computer graphics Mustererkennung Konferenzschrift 2018 Peking
url	https://doi.org/10.1007/978-3-030-05792-3
volume_link	(DE-604)BV014880109
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