Verfügbarkeit: Scanning electron microscopy and x-ray microanalysis

Scanning electron microscopy and x-ray microanalysis:

Gespeichert in:

Bibliographische Detailangaben
Beteiligte Personen:	Goldstein, Joseph 1939-2015 (VerfasserIn), Newbury, Dale E. (VerfasserIn), Michael, Joseph R. (VerfasserIn), Ritchie, Nicholas W. M. (VerfasserIn), Scott, John Henry J. (VerfasserIn), Joy, David C. 1943- (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	New York, NY Springer [2018]
Ausgabe:	Fourth edition
Schlagwörter:	Scanning electron microscopy X-ray microanalysis Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie
Umfang:	XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig)
ISBN:	9781493966745

Internformat

MARC


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250			\|a Fourth edition
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700	1		\|a Joy, David C. \|d 1943- \|0 (DE-588)17217242X \|4 aut
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Datensatz im Suchindex

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author	Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943-
author_GND	(DE-588)1023852381 (DE-588)17217242X
author_facet	Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943-
author_role	aut aut aut aut aut aut
author_sort	Goldstein, Joseph 1939-2015
author_variant	j g jg d e n de den j r m jr jrm n w m r nwm nwmr j h j s jhj jhjs d c j dc dcj
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callnumber-first	Q - Science
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callnumber-raw	QH212.S3
callnumber-search	QH212.S3
callnumber-sort	QH 3212 S3
callnumber-subject	QH - Natural History and Biology
classification_rvk	YV 5017 UH 6310 UH 6320 VG 9900
classification_tum	CHE 264f PHY 135f
ctrlnum	(OCoLC)254505502 (DE-599)BV044210672
dewey-full	502.825
dewey-hundreds	500 - Natural sciences and mathematics
dewey-ones	502 - Miscellany
dewey-raw	502.825
dewey-search	502.825
dewey-sort	3502.825
dewey-tens	500 - Natural sciences and mathematics
discipline	Chemie / Pharmazie Allgemeine Naturwissenschaft Physik Medizin
edition	Fourth edition
format	Book
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illustrated	Illustrated
indexdate	2025-01-11T13:28:54Z
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isbn	9781493966745
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-029616953
oclc_num	254505502
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owner_facet	DE-19 DE-BY-UBM DE-11 DE-703 DE-20 DE-29 DE-384 DE-634 DE-578 DE-706 DE-1043 DE-355 DE-BY-UBR
physical	XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig)
publishDate	2018
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publisher	Springer
record_format	marc
spelling	Goldstein, Joseph 1939-2015 (DE-588)1023852381 aut Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy Fourth edition New York, NY Springer [2018] © 2018 XXIII, 550 Seiten Illustrationen, Diagramme (teilweise farbig) txt rdacontent n rdamedia nc rdacarrier Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 2\p DE-604 Newbury, Dale E. aut Michael, Joseph R. aut Ritchie, Nicholas W. M. aut Scott, John Henry J. aut Joy, David C. 1943- (DE-588)17217242X aut Erscheint auch als Online-Ausgabe, eBook 978-1-4939-6676-9 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- Scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd
subject_GND	(DE-588)4065579-9 (DE-588)4151898-6 (DE-588)4320991-9 (DE-588)4048455-5
title	Scanning electron microscopy and x-ray microanalysis
title_auth	Scanning electron microscopy and x-ray microanalysis
title_exact_search	Scanning electron microscopy and x-ray microanalysis
title_full	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
title_fullStr	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
title_full_unstemmed	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy
title_short	Scanning electron microscopy and x-ray microanalysis
title_sort	scanning electron microscopy and x ray microanalysis
topic	Scanning electron microscopy X-ray microanalysis Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd
topic_facet	Scanning electron microscopy X-ray microanalysis Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie
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Verfügbarkeit

MARC

Datensatz im Suchindex

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