Wafer-level testing and test during burn-in for integrated circuits:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Boston
Artech House
2010
|
| Schriftenreihe: | Artech House integrated microsystems series
|
| Schlagwörter: | |
| Beschreibung: | Includes bibliographical references and index |
| Umfang: | xv, 198 p. |
| ISBN: | 9781596939899 1596939893 |
Internformat
MARC
| LEADER | 00000nam a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044166473 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170217s2010 xx o|||| 00||| eng d | ||
| 020 | |a 9781596939899 |9 978-1-59693-989-9 | ||
| 020 | |a 1596939893 |9 1-59693-989-3 | ||
| 035 | |a (ZDB-30-PAD)EBC946559 | ||
| 035 | |a (ZDB-89-EBL)EBL946559 | ||
| 035 | |a (OCoLC)796382946 | ||
| 035 | |a (DE-599)BVBBV044166473 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.38132 |2 22 | |
| 100 | 1 | |a Bahukudumbi, Sudarshan |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Wafer-level testing and test during burn-in for integrated circuits |c Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| 264 | 1 | |a Boston |b Artech House |c 2010 | |
| 300 | |a xv, 198 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Artech House integrated microsystems series | |
| 500 | |a Includes bibliographical references and index | ||
| 650 | 4 | |a Integrated circuits |x Testing | |
| 650 | 4 | |a Integrated circuits |x Wafer-scale integration | |
| 650 | 4 | |a Semiconductors |x Testing | |
| 700 | 1 | |a Chakrabarty, Krishnendu |e Sonstige |4 oth | |
| 912 | |a ZDB-30-PAD | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-029573318 | |
Datensatz im Suchindex
| _version_ | 1818982978125037568 |
|---|---|
| any_adam_object | |
| author | Bahukudumbi, Sudarshan |
| author_facet | Bahukudumbi, Sudarshan |
| author_role | aut |
| author_sort | Bahukudumbi, Sudarshan |
| author_variant | s b sb |
| building | Verbundindex |
| bvnumber | BV044166473 |
| collection | ZDB-30-PAD |
| ctrlnum | (ZDB-30-PAD)EBC946559 (ZDB-89-EBL)EBL946559 (OCoLC)796382946 (DE-599)BVBBV044166473 |
| dewey-full | 621.38132 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.38132 |
| dewey-search | 621.38132 |
| dewey-sort | 3621.38132 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01251nam a2200373zc 4500</leader><controlfield tag="001">BV044166473</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170217s2010 xx o|||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781596939899</subfield><subfield code="9">978-1-59693-989-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1596939893</subfield><subfield code="9">1-59693-989-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC946559</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL946559</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)796382946</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044166473</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.38132</subfield><subfield code="2">22</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bahukudumbi, Sudarshan</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Wafer-level testing and test during burn-in for integrated circuits</subfield><subfield code="c">Sudarshan Bahukudumbi, Krishnendu Chakrabarty</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston</subfield><subfield code="b">Artech House</subfield><subfield code="c">2010</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xv, 198 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Artech House integrated microsystems series</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Wafer-scale integration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chakrabarty, Krishnendu</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PAD</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029573318</subfield></datafield></record></collection> |
| id | DE-604.BV044166473 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:55:48Z |
| institution | BVB |
| isbn | 9781596939899 1596939893 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029573318 |
| oclc_num | 796382946 |
| open_access_boolean | |
| physical | xv, 198 p. |
| psigel | ZDB-30-PAD |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House integrated microsystems series |
| spelling | Bahukudumbi, Sudarshan Verfasser aut Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty Boston Artech House 2010 xv, 198 p. txt rdacontent c rdamedia cr rdacarrier Artech House integrated microsystems series Includes bibliographical references and index Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing Chakrabarty, Krishnendu Sonstige oth |
| spellingShingle | Bahukudumbi, Sudarshan Wafer-level testing and test during burn-in for integrated circuits Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| title | Wafer-level testing and test during burn-in for integrated circuits |
| title_auth | Wafer-level testing and test during burn-in for integrated circuits |
| title_exact_search | Wafer-level testing and test during burn-in for integrated circuits |
| title_full | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_fullStr | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_full_unstemmed | Wafer-level testing and test during burn-in for integrated circuits Sudarshan Bahukudumbi, Krishnendu Chakrabarty |
| title_short | Wafer-level testing and test during burn-in for integrated circuits |
| title_sort | wafer level testing and test during burn in for integrated circuits |
| topic | Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| topic_facet | Integrated circuits Testing Integrated circuits Wafer-scale integration Semiconductors Testing |
| work_keys_str_mv | AT bahukudumbisudarshan waferleveltestingandtestduringburninforintegratedcircuits AT chakrabartykrishnendu waferleveltestingandtestduringburninforintegratedcircuits |