Thin film materials: stress, defect formation, and surface evolution
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Cambridge, UK
Cambridge University Press
2003
|
| Schlagwörter: | |
| Links: | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152232 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152232 http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152232 |
| Beschreibung: | Includes bibliographical references (p. 713-737) and index 1 - Introduction and Overview -- - 2 - Film stress and substrate curvature -- - 3 - Stress in anisotropic and patterned films -- - 4 - Delamination and fracture -- - 5 - Film buckling, bulging and peeling -- - 6 - Dislocation formation in epitaxial systems -- - 7 - Dislocation interactions and strain relaxation -- - 8 - Equilibrium and stability of surfaces -- - 9 - The role of stress in mass transport "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Book jacket |
| Umfang: | 1 Online-Ressource (xviii, 750 p.) |
| ISBN: | 051116372X 0511164521 051116565X 0511184123 051175471X 0521822815 9780511163722 9780511164521 9780511165658 9780511184123 9780511754715 9780521822817 |
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| 500 | |a Includes bibliographical references (p. 713-737) and index | ||
| 500 | |a 1 - Introduction and Overview -- - 2 - Film stress and substrate curvature -- - 3 - Stress in anisotropic and patterned films -- - 4 - Delamination and fracture -- - 5 - Film buckling, bulging and peeling -- - 6 - Dislocation formation in epitaxial systems -- - 7 - Dislocation interactions and strain relaxation -- - 8 - Equilibrium and stability of surfaces -- - 9 - The role of stress in mass transport | ||
| 500 | |a "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate | ||
| 500 | |a While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Book jacket | ||
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Datensatz im Suchindex
| _version_ | 1818981288772632576 |
|---|---|
| any_adam_object | |
| author | Freund, L. B. |
| author_facet | Freund, L. B. |
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| bvnumber | BV043125849 |
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| ctrlnum | (OCoLC)80244620 (DE-599)BVBBV043125849 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV043125849 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T17:28:57Z |
| institution | BVB |
| isbn | 051116372X 0511164521 051116565X 0511184123 051175471X 0521822815 9780511163722 9780511164521 9780511165658 9780511184123 9780511754715 9780521822817 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028550040 |
| oclc_num | 80244620 |
| open_access_boolean | |
| owner | DE-1046 DE-1047 |
| owner_facet | DE-1046 DE-1047 |
| physical | 1 Online-Ressource (xviii, 750 p.) |
| psigel | ZDB-4-EBA ZDB-4-EBA FAW_PDA_EBA |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Cambridge University Press |
| record_format | marc |
| spelling | Freund, L. B. Verfasser aut Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh Cambridge, UK Cambridge University Press 2003 1 Online-Ressource (xviii, 750 p.) txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 713-737) and index 1 - Introduction and Overview -- - 2 - Film stress and substrate curvature -- - 3 - Stress in anisotropic and patterned films -- - 4 - Delamination and fracture -- - 5 - Film buckling, bulging and peeling -- - 6 - Dislocation formation in epitaxial systems -- - 7 - Dislocation interactions and strain relaxation -- - 8 - Equilibrium and stability of surfaces -- - 9 - The role of stress in mass transport "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Book jacket TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 s Werkstoffkunde (DE-588)4079184-1 s 1\p DE-604 Suresh, S. Sonstige oth http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152232 Aggregator Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Freund, L. B. Thin film materials stress, defect formation, and surface evolution TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4136925-7 (DE-588)4079184-1 |
| title | Thin film materials stress, defect formation, and surface evolution |
| title_auth | Thin film materials stress, defect formation, and surface evolution |
| title_exact_search | Thin film materials stress, defect formation, and surface evolution |
| title_full | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_fullStr | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_full_unstemmed | Thin film materials stress, defect formation, and surface evolution L.B. Freund, S. Suresh |
| title_short | Thin film materials |
| title_sort | thin film materials stress defect formation and surface evolution |
| title_sub | stress, defect formation, and surface evolution |
| topic | TECHNOLOGY & ENGINEERING / Electronics / Solid State bisacsh TECHNOLOGY & ENGINEERING / Electronics / Semiconductors bisacsh Surfaces (Technology) fast Thin films fast Thin films Surfaces (Technology) Dünne Schicht (DE-588)4136925-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Electronics / Solid State TECHNOLOGY & ENGINEERING / Electronics / Semiconductors Surfaces (Technology) Thin films Dünne Schicht Werkstoffkunde |
| url | http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=152232 |
| work_keys_str_mv | AT freundlb thinfilmmaterialsstressdefectformationandsurfaceevolution AT sureshs thinfilmmaterialsstressdefectformationandsurfaceevolution |