Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
New York, NY
Springer
2010
|
| Schlagwörter: | |
| Beschreibung: | Literaturverz. S. 317 - 322 |
| Umfang: | XI, 330 S. zahlr. Ill., graph. Darst. |
| ISBN: | 9780387857312 9781441946744 |
Internformat
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| 264 | 1 | |a New York, NY |b Springer |c 2010 | |
| 300 | |a XI, 330 S. |b zahlr. Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| any_adam_object | |
| author | Echlin, Patrick |
| author_facet | Echlin, Patrick |
| author_role | aut |
| author_sort | Echlin, Patrick |
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| building | Verbundindex |
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| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.S3 |
| callnumber-search | QH212.S3 |
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| classification_rvk | UH 6300 UH 6310 |
| ctrlnum | (OCoLC)928729790 (DE-599)BVBBV042912990 |
| dewey-full | 502.285 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.285 |
| dewey-search | 502.285 |
| dewey-sort | 3502.285 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
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| id | DE-604.BV042912990 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T17:23:06Z |
| institution | BVB |
| isbn | 9780387857312 9781441946744 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028340723 |
| oclc_num | 928729790 |
| open_access_boolean | |
| owner | DE-29 |
| owner_facet | DE-29 |
| physical | XI, 330 S. zahlr. Ill., graph. Darst. |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | Springer |
| record_format | marc |
| spelling | Echlin, Patrick Verfasser aut Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin New York, NY Springer 2010 XI, 330 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 317 - 322 Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s |
| spellingShingle | Echlin, Patrick Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4048455-5 (DE-588)4151898-6 |
| title | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_auth | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_full | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_fullStr | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_full_unstemmed | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis Patrick Echlin |
| title_short | Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis |
| title_sort | handbook of sample preparation for scanning electron microscopy and x ray microanalysis |
| topic | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Scanning electron microscopy X-ray microanalysis Rasterelektronenmikroskopie Elektronenstrahlmikroanalyse |
| work_keys_str_mv | AT echlinpatrick handbookofsamplepreparationforscanningelectronmicroscopyandxraymicroanalysis |