Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
Gespeichert in:
Beteiligte Personen: | , , |
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Format: | Elektronisch E-Book |
Sprache: | Englisch |
Veröffentlicht: |
New York, NY
Springer New York
2011
|
Ausgabe: | 1. Aufl. |
Links: | https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 https://doi.org/10.1007/978-1-4419-6217-1 |
Umfang: | 1 Online-Ressource (250 S.) 100 schw.-w. Ill. |
ISBN: | 9781441962171 |
DOI: | 10.1007/978-1-4419-6217-1 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author | Stanisavljevic, Milos Schmid, Alexandre Leblebici, Yusuf 1962- |
author_GND | (DE-588)13972513X |
author_facet | Stanisavljevic, Milos Schmid, Alexandre Leblebici, Yusuf 1962- |
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building | Verbundindex |
bvnumber | BV036850846 |
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ctrlnum | (OCoLC)873712988 (DE-599)DNB1007733977 |
discipline | Maschinenbau / Maschinenwesen |
doi_str_mv | 10.1007/978-1-4419-6217-1 |
edition | 1. Aufl. |
format | Electronic eBook |
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id | DE-604.BV036850846 |
illustrated | Illustrated |
indexdate | 2024-12-20T14:43:14Z |
institution | BVB |
isbn | 9781441962171 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020766816 |
oclc_num | 873712988 |
open_access_boolean | |
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physical | 1 Online-Ressource (250 S.) 100 schw.-w. Ill. |
psigel | ZDB-2-ENG |
publishDate | 2011 |
publishDateSearch | 2011 |
publishDateSort | 2011 |
publisher | Springer New York |
record_format | marc |
spelling | Stanisavljevic, Milos Verfasser aut Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures Milos Stanisavljevic ; Alexandre Schmid ; Yusuf Leblebici 1. Aufl. New York, NY Springer New York 2011 1 Online-Ressource (250 S.) 100 schw.-w. Ill. txt rdacontent c rdamedia cr rdacarrier Schmid, Alexandre Verfasser aut Leblebici, Yusuf 1962- Verfasser (DE-588)13972513X aut Erscheint auch als Druck-Ausgabe, Hardcover 978-1-441-96216-4 https://doi.org/10.1007/978-1-4419-6217-1 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Stanisavljevic, Milos Schmid, Alexandre Leblebici, Yusuf 1962- Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
title | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
title_auth | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
title_exact_search | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures |
title_full | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures Milos Stanisavljevic ; Alexandre Schmid ; Yusuf Leblebici |
title_fullStr | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures Milos Stanisavljevic ; Alexandre Schmid ; Yusuf Leblebici |
title_full_unstemmed | Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures Milos Stanisavljevic ; Alexandre Schmid ; Yusuf Leblebici |
title_short | Reliability of Nanoscale Circuits and Systems |
title_sort | reliability of nanoscale circuits and systems methodologies and circuit architectures |
title_sub | Methodologies and Circuit Architectures |
url | https://doi.org/10.1007/978-1-4419-6217-1 |
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