Soft Errors in Modern Electronic Systems:
Gespeichert in:
Weitere beteiligte Personen: | |
---|---|
Format: | Elektronisch E-Book |
Sprache: | Englisch |
Veröffentlicht: |
Berlin
Springer US
2011
|
Ausgabe: | 1. ed. |
Schriftenreihe: | Frontiers in Electronic Testing
41 |
Schlagwörter: | |
Links: | https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 https://doi.org/10.1007/978-1-4419-6993-4 |
Umfang: | 1 Online-Ressource (XII, 368 S.) zahlr. Ill., graph. Darst. |
ISBN: | 9781441969934 |
DOI: | 10.1007/978-1-4419-6993-4 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV036749157 | ||
003 | DE-604 | ||
005 | 20130415 | ||
007 | cr|uuu---uuuuu | ||
008 | 101029s2011 gw ad|| o|||| 00||| eng d | ||
015 | |a 10,N22 |2 dnb | ||
020 | |a 9781441969934 |c Online |9 978-1-4419-6993-4 | ||
024 | 7 | |a 10.1007/978-1-4419-6993-4 |2 doi | |
024 | 3 | |a 9781441969927 | |
028 | 5 | 2 | |a 12235865 |
035 | |a (OCoLC)873709981 | ||
035 | |a (DE-599)BVBBV036749157 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
044 | |a gw |c XA-DE-BE | ||
049 | |a DE-634 |a DE-1043 |a DE-Aug4 |a DE-92 |a DE-898 |a DE-863 |a DE-862 |a DE-859 |a DE-573 | ||
084 | |a 620 |2 sdnb | ||
245 | 1 | 0 | |a Soft Errors in Modern Electronic Systems |c Hrsg. Michael Nicolaidis |
250 | |a 1. ed. | ||
264 | 1 | |a Berlin |b Springer US |c 2011 | |
300 | |a 1 Online-Ressource (XII, 368 S.) |b zahlr. Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 1 | |a Frontiers in Electronic Testing |v 41 | |
650 | 4 | |a Ingenieurwissenschaften | |
650 | 4 | |a Engineering | |
650 | 4 | |a Operating systems (Computers) | |
650 | 4 | |a Computer system performance | |
650 | 4 | |a Computer engineering | |
650 | 4 | |a Systems engineering | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a System Performance and Evaluation | |
650 | 4 | |a Performance and Reliability | |
650 | 4 | |a Electrical Engineering | |
700 | 1 | |a Nicolaidis, Michael |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-1-441-96992-7 |
830 | 0 | |a Frontiers in Electronic Testing |v 41 |w (DE-604)BV010836129 |9 41 | |
856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4419-6993-4 |x Verlag |3 Volltext |
912 | |a ZDB-2-ENG | ||
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-020666446 | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-634 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-1043 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-Aug4 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-573 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-92 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-898 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-859 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-863 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-1-4419-6993-4 |l DE-862 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1818970736956538880 |
---|---|
any_adam_object | |
author2 | Nicolaidis, Michael |
author2_role | edt |
author2_variant | m n mn |
author_facet | Nicolaidis, Michael |
building | Verbundindex |
bvnumber | BV036749157 |
collection | ZDB-2-ENG |
ctrlnum | (OCoLC)873709981 (DE-599)BVBBV036749157 |
discipline | Maschinenbau / Maschinenwesen |
doi_str_mv | 10.1007/978-1-4419-6993-4 |
edition | 1. ed. |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02614nam a2200625 cb4500</leader><controlfield tag="001">BV036749157</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20130415 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">101029s2011 gw ad|| o|||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">10,N22</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781441969934</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-4419-6993-4</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4419-6993-4</subfield><subfield code="2">doi</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9781441969927</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">12235865</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)873709981</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV036749157</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-573</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">620</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Soft Errors in Modern Electronic Systems</subfield><subfield code="c">Hrsg. Michael Nicolaidis</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Springer US</subfield><subfield code="c">2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XII, 368 S.)</subfield><subfield code="b">zahlr. Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">41</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Operating systems (Computers)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer system performance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">System Performance and Evaluation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Performance and Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nicolaidis, Michael</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-1-441-96992-7</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">41</subfield><subfield code="w">(DE-604)BV010836129</subfield><subfield code="9">41</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-020666446</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4419-6993-4</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV036749157 |
illustrated | Illustrated |
indexdate | 2024-12-20T14:41:14Z |
institution | BVB |
isbn | 9781441969934 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020666446 |
oclc_num | 873709981 |
open_access_boolean | |
owner | DE-634 DE-1043 DE-Aug4 DE-92 DE-898 DE-BY-UBR DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-859 DE-573 |
owner_facet | DE-634 DE-1043 DE-Aug4 DE-92 DE-898 DE-BY-UBR DE-863 DE-BY-FWS DE-862 DE-BY-FWS DE-859 DE-573 |
physical | 1 Online-Ressource (XII, 368 S.) zahlr. Ill., graph. Darst. |
psigel | ZDB-2-ENG |
publishDate | 2011 |
publishDateSearch | 2011 |
publishDateSort | 2011 |
publisher | Springer US |
record_format | marc |
series | Frontiers in Electronic Testing |
series2 | Frontiers in Electronic Testing |
spelling | Soft Errors in Modern Electronic Systems Hrsg. Michael Nicolaidis 1. ed. Berlin Springer US 2011 1 Online-Ressource (XII, 368 S.) zahlr. Ill., graph. Darst. txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 41 Ingenieurwissenschaften Engineering Operating systems (Computers) Computer system performance Computer engineering Systems engineering Circuits and Systems System Performance and Evaluation Performance and Reliability Electrical Engineering Nicolaidis, Michael edt Erscheint auch als Druck-Ausgabe, Hardcover 978-1-441-96992-7 Frontiers in Electronic Testing 41 (DE-604)BV010836129 41 https://doi.org/10.1007/978-1-4419-6993-4 Verlag Volltext |
spellingShingle | Soft Errors in Modern Electronic Systems Frontiers in Electronic Testing Ingenieurwissenschaften Engineering Operating systems (Computers) Computer system performance Computer engineering Systems engineering Circuits and Systems System Performance and Evaluation Performance and Reliability Electrical Engineering |
title | Soft Errors in Modern Electronic Systems |
title_auth | Soft Errors in Modern Electronic Systems |
title_exact_search | Soft Errors in Modern Electronic Systems |
title_full | Soft Errors in Modern Electronic Systems Hrsg. Michael Nicolaidis |
title_fullStr | Soft Errors in Modern Electronic Systems Hrsg. Michael Nicolaidis |
title_full_unstemmed | Soft Errors in Modern Electronic Systems Hrsg. Michael Nicolaidis |
title_short | Soft Errors in Modern Electronic Systems |
title_sort | soft errors in modern electronic systems |
topic | Ingenieurwissenschaften Engineering Operating systems (Computers) Computer system performance Computer engineering Systems engineering Circuits and Systems System Performance and Evaluation Performance and Reliability Electrical Engineering |
topic_facet | Ingenieurwissenschaften Engineering Operating systems (Computers) Computer system performance Computer engineering Systems engineering Circuits and Systems System Performance and Evaluation Performance and Reliability Electrical Engineering |
url | https://doi.org/10.1007/978-1-4419-6993-4 |
volume_link | (DE-604)BV010836129 |
work_keys_str_mv | AT nicolaidismichael softerrorsinmodernelectronicsystems |