Ultra-fast material metrology:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Weinheim
Wiley-VCH-Verl.
2009
|
| Schlagwörter: | |
| Links: | http://deposit.dnb.de/cgi-bin/dokserv?id=3261155&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=018663678&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| Beschreibung: | Literaturverz. S. 183 - 193 |
| Umfang: | XVI, 206 S. Ill., graph. Darst. |
| ISBN: | 9783527408870 |
Internformat
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Datensatz im Suchindex
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|---|---|
| adam_text | IX CONTENTS A PERSONAL FOREWORD VII PREFOCE TO THE FIRST EDITION XIII
ACKNOWLEDGMENT XV 1 INTRODUCTION 1 1.1 MOTIVATION 1 1.2 DEFINITION OF
OPTICAL PUMP AND PROBE 4 1.3 GUIDELINE 4 1.4 MATRIX OF LASER EFFECTS AND
APPLICATIONS 5 1.5 HISTORICAL SURVEY OF OPTICAL ULTRA-FAST METROLOGY 6
1.5.1 METROLOGY TECHNIQUES BEFORE THE ADVENT OF LASER 6 1.5.2 ULTRA-FAST
PUMP AND PROBE METROLOGY 7 2 ULTRA-FAST ENGINEERING WORKING TOOLS 11 2.1
ULTRA-FAST LASER SOURCES 11 2.1.1 GENERAL ASPECTS FOR ULTRA-PRECISE
ENGINEERING 12 2.1.2 GENERAL ASPECTS ON ULTRA-FAST LASERS FOR ULTRA-FAST
METROLOGY 13 2.1.3 LASER OSCILLATOR 15 2.1.3.1 ROD AND DISK SOLID-STATE
LASER 15 2.1.3.2 FIBER OSCILLATOR 16 2.1.4 AMPLIFIER 18 2.1.4.1
AMPLIFICATION MEDIA 18 2.1.4.2 CHIRPED-PULSE AMPLIFICATION (CPA) 18
2.1.4.3 OPTICAL PARAMETRIC CHIRPED-PULSE AMPLIFICATION (OPCPA) 19
2.1.4.4 AMPLIFIER DESIGNS 20 BIBLIOGRAFISCHE INFORMATIONEN
HTTP://D-NB.INFO/993261302 DIGITALISIERT DURCH CONTENTS 2.2.6 KEY
PARAMETERS FOR ULTRA-PRECISION MACHINING AND DIAGNOSTICS 35 2.2.6.1
ULTRA-PRECISE MACHINING 35 2.2.6.2 ULTRA-FAST PUMP AND PROBE DIAGNOSTICS
FOR MECHANICAL ENGINEERING 36 2.3 BEAM POSITIONING AND SCANNING 36 2.3.1
POSITIONING 37 2.3.2 SCANNING SYSTEMS 39 2.4 NEW CHALLENGES TO
ULTRA-FAST METROLOGY 41 2.4.1 TEMPORAL DOMAIN 42 2.4.2 SPATIAL DOMAIN 42
2.5 DOMAINS OF OPTICAL PUMP AND PROBE TECHNIQUES FOR PROCESS DIAGNOSIS
43 3 FUNDAMENTALS OF LASER INTERACTION 45 3.1 LINEAR TO NON-LINEAR
OPTICS 45 3.1.1 LINEAR OPTICS: GROUP VELOCITY DISPERSION AND CHIRP 45
3.1.2 NON-LINEAR PROCESSES 48 3.1.2.1 NON-LINEAR POLARIZATION 48 3.1.2.2
SELF-FOCUSING 49 3.1.2.3 SPECTRAL BROADENING BY SELF-PHASE MODULATION 51
3.1.2.4 CATASTROPHIC SELF-FOCUSING 53 3.2 HIGH-POWER PHOTON-MATTER
INTERACTION 54 3.2.1 ABSORPTION OF LASER RADIATION IN MATTER 54 3.2.2
ENERGY TRANSFER FROM ELECTRONS TO MATTER 56 CONTENTS XI 4.2 PREPARATION
OF STATES AND CONDITIONS FOR PROBE BEAMS 85 4.2.1 PREPARATION OF STATES
86 4.2.2 PREPARATION OF STATES BY SPECTRO-TEMPORAL SHAPING 86 4.2.3
MEASUREMENT OF STATES 88 4.2.4 MEASUREMENT OF RADIATION PROPERTIES 89
4.2.4.1 PULSE DURATION 89 4.2.4.2 SPECTRAL PHASE 90 4.3 IMAGING WITH
ULTRA-FAST LASER RADIATION 91 4.3.1 DIFFRACTION THEORY AND INCOHERENT
ILLUMINATION 91 4.3.2 IMAGE FORMATION BY MICROSCOPY AND COHERENT
ILLUMINATION 95 4.4 TEMPORAL DELAYING 97 A A.I MECHANICAL DELAY 98
4.4.1.1 SINGLE-PASS DELAY STAGE 98 4.4.1.2 MULTI-PASS DELAY STAGE 99
4.4.1.3 MECHANICAL OPTOELECTRONIC SCANNING 203 4.4.2 NON-MECHANICAL
DELAY 101 4.4.2.1 FREE-RUNNING LASERS 102 4.4.2.2 SYNCHRONIZED LASERS
103 5 EXAMPLES FOR ULTRA-FAST DETECTION METHODS 105 5.1 NON-IMAGING
DETECTION 106 5.1.1 TRANSIENT ABSORPTION SPECRROSCOPY (TAS) 106 5.1.1.1
PRINCIPLE AND SETUP 106 5.1.1.2 CHARACTERIZATION OF THE WHITE-LIGHT
CONTINUUM 108 XII CONTENTS 6.3.2 DETECTION OF LASER-INDUCED DEFECTS 141
6.3.3 DETECTION OF REFRACTIVE-INDEX CHANGES AND CRACKING 243 6.4 WELDING
OF TECHNICAL GLASSES AND SILICON 145 6.4.1 INTRODUCTION 145 6.4.2
DETECTION OF LASER-INDUCED MELTING 146 7 PERSPECTIVES FOR THE FUTURE 151
7.1 LASER AND OTHER SOURCES 252 7.2 METHODOLOGY 253 7.2.1 SCANNING
TECHNOLOGY 153 7.2.1.1 SPATIAL SCANNING 153 7.2.1.2 TEMPORAL SCANNING
153 7.2.2 BEAM SHAPING 353 7.2.2.1 SPATIAL SHAPING 153 7.2.2.2 TEMPORAL
SHAPING 154 8 SUMMARY 255 APPENDIX A LOCK-IN AMPLIFIER 259 APPENDIX B
ONSET ON OPTICS 261 B.I ABBE SINE CONDITION 262 B.2 QUANTITATIVE PHASE
MICROSCOPY 262 APPENDIX C PLASMA PARAMETERS 165 C.I TRANSPORT
COEFFICIENTS 165 C.I.I ELECTRICAL CONDUCTIVITY 265 C.I.2 THERMAL
CONDUCTIVITY 265 C.I.3 DIFFUSIVITY OF ELECTRONS 166 C.I.4 VISCOSITY 167
C.2 DEBYE LENGTH 168 C.3 PLASMA OSCILLATIONS AND WAVES 269 C.4 COUPLING
BETWEEN ELECTRONS AND IONS 172 C.
|
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| indexdate | 2024-12-20T14:00:35Z |
| institution | BVB |
| isbn | 9783527408870 |
| language | English |
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| spellingShingle | Horn, Alexander 1969- Ultra-fast material metrology Lasermesstechnik - Pump-Probe-Technik Lasers Metrology Lasermesstechnik (DE-588)4166812-1 gnd Pump-Probe-Technik (DE-588)4601119-5 gnd |
| subject_GND | (DE-588)4166812-1 (DE-588)4601119-5 |
| title | Ultra-fast material metrology |
| title_auth | Ultra-fast material metrology |
| title_exact_search | Ultra-fast material metrology |
| title_full | Ultra-fast material metrology Alexander Horn |
| title_fullStr | Ultra-fast material metrology Alexander Horn |
| title_full_unstemmed | Ultra-fast material metrology Alexander Horn |
| title_short | Ultra-fast material metrology |
| title_sort | ultra fast material metrology |
| topic | Lasermesstechnik - Pump-Probe-Technik Lasers Metrology Lasermesstechnik (DE-588)4166812-1 gnd Pump-Probe-Technik (DE-588)4601119-5 gnd |
| topic_facet | Lasermesstechnik - Pump-Probe-Technik Lasers Metrology Lasermesstechnik Pump-Probe-Technik |
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