Verfügbarkeit: Materials characterization techniques

Materials characterization techniques:

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Bibliographische Detailangaben
Beteiligte Personen:	Zhang, Sam (VerfasserIn), Li, Lin (VerfasserIn), Kumar, Ashok (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	Boca Raton [u.a.] CRC Press 2009
Ausgabe:	1st ed.
Schlagwörter:	Materiaalonderzoek Matériaux - Essais Wetenschappelijke technieken Wissenschaftliches Arbeiten Materials > Testing Werkstoff Eigenschaft Methode Werkstoffprüfung
Links:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016761627&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Beschreibung:	Includes bibliographical references and index
Umfang:	328 S. Ill., graph. Darst. 24 cm
ISBN:	9781420042948 1420042947

Internformat

MARC


LEADER	00000nam a2200000zc 4500
001	BV035093549
003	DE-604
005	20090708
007	t\|
008	081010s2009 xxuad\|\| \|\|\|\| 00\|\|\| eng d
010			\|a 2008030739
020			\|a 9781420042948 \|c alk. paper \|9 978-1-4200-4294-8
020			\|a 1420042947 \|c alk. paper \|9 1-4200-4294-7
035			\|a (OCoLC)144523105
035			\|a (DE-599)BVBBV035093549
040			\|a DE-604 \|b ger \|e aacr
041	0		\|a eng
044			\|a xxu \|c US
049			\|a DE-703 \|a DE-210 \|a DE-91G \|a DE-29T
050		0	\|a TA410
082	0		\|a 620.1/10287
084			\|a UP 9000 \|0 (DE-625)146451: \|2 rvk
084			\|a WER 700f \|2 stub
100	1		\|a Zhang, Sam \|e Verfasser \|4 aut
245	1	0	\|a Materials characterization techniques \|c Sam Zhang, Lin Li, Ashok Kumar
250			\|a 1st ed.
264		1	\|a Boca Raton [u.a.] \|b CRC Press \|c 2009
300			\|a 328 S. \|b Ill., graph. Darst. \|c 24 cm
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
500			\|a Includes bibliographical references and index
520	1		\|a "With an emphasis on practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. The book reviews the most popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements. The text features coverage of a wide range of topics, including Auger electron spectroscopy, atomic force microscopy, transmission electron microscopy, gel electrophoresis chromatography, laser confocal scanning florescent microscopy, and UV spectroscopy."--BOOK JACKET.
650		7	\|a Materiaalonderzoek \|2 gtt
650		4	\|a Matériaux - Essais
650		7	\|a Wetenschappelijke technieken \|2 gtt
650		4	\|a Wissenschaftliches Arbeiten
650		4	\|a Materials \|x Testing
650	0	7	\|a Werkstoff \|0 (DE-588)4065579-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Eigenschaft \|0 (DE-588)4151179-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Methode \|0 (DE-588)4038971-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Werkstoffprüfung \|0 (DE-588)4037934-6 \|2 gnd \|9 rswk-swf
689	0	0	\|a Werkstoffprüfung \|0 (DE-588)4037934-6 \|D s
689	0		\|5 DE-604
689	1	0	\|a Werkstoff \|0 (DE-588)4065579-9 \|D s
689	1	1	\|a Eigenschaft \|0 (DE-588)4151179-7 \|D s
689	1	2	\|a Methode \|0 (DE-588)4038971-6 \|D s
689	1		\|5 DE-604
700	1		\|a Li, Lin \|e Verfasser \|4 aut
700	1		\|a Kumar, Ashok \|e Verfasser \|4 aut
856	4	2	\|m Digitalisierung UB Bayreuth \|q application/pdf \|u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016761627&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA \|3 Inhaltsverzeichnis
943	1		\|a oai:aleph.bib-bvb.de:BVB01-016761627

Datensatz im Suchindex

DE-BY-TUM_call_number	0302 WER 700f 2009 A 3914
DE-BY-TUM_katkey	1690961
DE-BY-TUM_location	03
DE-BY-TUM_media_number	040030231919
_version_	1821933664414466048
adam_text	Contents Preface .............................................................................................................xiii 1 Introduction ............................................................................................1 2 Contact Angle in Surface Analysis ....................................................3 2.1 Introduction .............................................................................................3 2.2 Measuring Contact Angle .....................................................................6 2.2.1 Static and Dynamic Sessile Drop Method ...........................7 2.2.1.1 Static Contact Angle ..............................................8 2.2.1.2 Dynamic Contact Angle ........................................8 2.2.2 Dynamic Wilhelmy Method ................................................10 2.2.3 Captive Air Bubble Method .................................................11 2.2.4 Capillary Rise Method ..........................................................11 2.2.5 Tilted-Drop Measurement ....................................................11 2.3 Determining Surface Energy of a Homogeneous Solid Surface ....................................................................................................11 2.3.1 Surface Tension Component ................................................13 2.3.1.1 Zisman ...................................................................13 2.3.1.2 Fowkes ...................................................................14 2.3.1.3 Owens-Wendt-Kaelble .......................................15 2.3.1.4 Lifshitz-van der Waals/Acid-Base (van Oss) .... 16 2.3.1.5 Wu ..........................................................................16 2.3.2 Equation of State ....................................................................18 2.3.2.1 Antonow s Rule ....................................................18 2.3.2.2 Berthelot s Rule .....................................................18 2.4 Work Examples .....................................................................................19 2.4.1 Fowkes .....................................................................................19 2.4.2 Case Study — Surface Energy of Amorphous Carbon ......21 2.5 Summary ...............................................................................................23 References ..........................................................................................................24 27 3 X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy ................................................................................. 3.1 Introduction ...........................................................................................27 3.2 Atomic Model and Electron Configuration ......................................28 3.2.1 Energy Levels .........................................................................30 3.2.2 Spin-Orbit Splitting ..............................................................31 3.2.3 Mean Free Path .......................................................................33 3.3 Principles of XPS and AES ..................................................................34 3.3.1 Photoionization ......................................................................34 3.3.2 Auger Electron Generation ...................................................36 3.3.3 Background Subtraction .......................................................39 3.3.4 Chemical Shift in XPS ...........................................................42 3.3.5 Quantitative Analysis ...........................................................44 3.3.6 Line Shape ..............................................................................52 3.3.7 Depth Profiling ......................................................................55 3.4 Instrumentation ....................................................................................56 3.4.1 The Vacuum System ..............................................................57 3.4.2 X-ray Sources ..........................................................................57 3.4.3 Monochromator .....................................................................59 3.4.4 Generation of Electron Beam ...............................................60 3.4.5 Analyzers ................................................................................62 3.4.6 Electron Detectors .................................................................63 3.4.7 Channel Electron Multipliers ...............................................64 3.4.8 Channel Plates ........................................................................64 3.4.9 Samples ...................................................................................64 3.4.10 Accessories ..............................................................................65 3.5 Routine Limits of XPS ..........................................................................65 3.5.1 Quantitative Accuracy ..........................................................65 3.5.2 Analysis Times .......................................................................66 3.5.3 Detection Limits .....................................................................66 3.5.4 Analysis Area Limits ............................................................66 3.5.5 Sample Size Limits ................................................................66 3.5.6 Degradation During Analysis .............................................66 3.5.7 Comparison Between AES and XPS, Energy-Dispersive X-ray Spectroscopy ..............................67 3.6 XPS Applications and Case Studies ...................................................67 3.6.1 Determination of Doping Effect ..........................................68 3.6.2 Chemical Reaction Determination ......................................70 3.6.3 Determination of Chemical Valence ...................................73 3.6.4 Depth Profiling ......................................................................74 3.6.5 Overlapping Problem ............................................................81 3.6.6 Determination of Film Composition ...................................82 3.7 AES Applications ..................................................................................85 3.7.1 Surface Element Determination ..........................................85 3.7.2 Concentration and Stoichiometry Determination ............85 3.7.3 Intensity-Time Curve ............................................................86 3.7.4 Chemical Shift ........................................................................87 3.7.5 Line Shape Changes ..............................................................88 3.7.6 Depth Profiling ......................................................................88 3.8 Summary ...............................................................................................89 References ..........................................................................................................90 4 Scanning Tunneling Microscopy and Atomic Force Microscopy ...........................................................................................95 4.1 Introduction ...........................................................................................95 4.2 Working Principle .................................................................................97 4.2.1 Scanning Tunneling Microscopy ........................................97 4.2.2 Atomic Force Microscopy .....................................................98 4.3 Instrumentation ..................................................................................100 4.3.1 Tip and Cantilever ...............................................................101 4.3.2 Piezoelectric Scanner ..........................................................101 4.3.3 Vibration Isolation ...............................................................104 4.3.4 Resolution .............................................................................104 4.4 Modes of Operation ...........................................................................106 4.4.1 Scanning Tunneling Microscopy ......................................106 4.4.1.1 Constant Current Mode ....................................106 4.4.1.2 Constant Height Mode ......................................106 4.4.2 Atomic Force Microscopy ...................................................106 4.4.2.1 Contact Mode ......................................................106 4.4.2.2 Noncontact Mode ...............................................107 4.4.2.3 Tapping Mode .....................................................108 4.5 Differences between STM and AFM ...............................................109 4.6 Applications .........................................................................................110 4.6.1 STM Studies ..........................................................................112 4.6.2 AFM Studies ..........................................................................115 References ........................................................................................................120 5 X-ray Diffraction ...............................................................................125 5.1 X-ray Characteristics and Generation ..............................................125 5.2 Lattice Planes and Bragg s Law ........................................................127 5.3 Powder Diffraction .............................................................................131 5.4 Thin Film Diffraction .........................................................................134 5.5 Texture Measurement ........................................................................142 5.6 Grazing Angle X-ray Diffraction ......................................................145 Acknowledgments .........................................................................................149 References ........................................................................................................149 6 Transmission Electron Microscopy ...............................................153 6.1 Basics of Transmission Electron Microscopes ................................153 6.2 Reciprocal Lattice ...............................................................................155 6.3 Specimen Preparation ........................................................................160 6.4 Bright-Field and Dark-Field Images ..................................................167 6.5 Electron Energy Loss Spectroscopy .................................................170 Acknowledgments .........................................................................................175 References ........................................................................................................175 7 Scanning Electron Microscopy ......................................................177 7.1 Introduction to Scanning Electron Microscopes ...........................177 7.1.1 Historical Background ........................................................177 7.1.2 Scanning Electron Microscopy Principles .......................178 7.1.2.1 The Electron Gun ...............................................180 7.1.2.2 The Condenser and Objective Lenses .............181 7.1.2.3 Scanning Coils ....................................................183 7.1.2.4 Specimen Chamber ............................................184 7.2 Electron Beam-Specimen Interaction ..............................................184 7.2.1 Backscattered Electrons ......................................................187 7.2.2 Secondary Electrons ............................................................188 7.2.3 Characteristic X-ray and Auger Electron Production .....188 7.3 SEM Operating Parameters ...............................................................190 7.3.1 General Aspects ...................................................................190 7.3.2 SEM Characteristics .............................................................190 7.3.2.1 Resolution ............................................................190 7.3.2.2 Depth of Field .....................................................191 7.3.3 SEM Operational Parameters .............................................192 7.4 Applications ........................................................................................193 7.4.1 Application of SEM in the Synthesis of Diamond Films ................................................................193 7.4.2 Applications of SEM in Electronic Devices ......................196 7.4.2.1 Fabrication of Diamond Microcantilevers .................................................196 7.4.2.2 Fabrication of Field Emitters .............................197 7.4.3 Application of SEM in the Synthesis of SiC Coatings .....................................................................197 7.4.4 SEM Analysis of Diamond-Coated WC-Co Substrate ..................................................................200 References ........................................................................................................205 8 Chromatographic Methods .............................................................207 8.1 Introduction .........................................................................................207 8.2 General Principles of Chromatography ..........................................209 8.2.1 Classification of Chromatography .....................................211 8.2.1.1 Normal-Phase and Reverse-Phase Chromatography .................................................211 8.2.2 Separation Modes and Mechanisms .................................212 8.2.2.1 Adsorption Chromatography ...........................212 8.2.2.2 Partition Chromatography ................................212 8.2.2.3 Bonded-Phase Chromatography ......................213 8.2.2.4 Ion Exchange Chromatography .......................213 8.2.2.5 Affinity Chromatography .................................213 8.2.2.6 Size Exclusion Chromatography .......................214 8.2.3 Fundamentals About Partition and Retention .................214 8.2.3.1 Partition and Partition Theory ..........................214 8.3 Ion Exchange Chromatography .......................................................217 8.3.1 Factors Affecting Separation by IEC .................................218 8.3.2 Separating Proteins .............................................................219 8.4 Gel Permeation Chromatography ....................................................220 8.4.1 Molecular Weights and Molecular Weight Distribution ..........................................................................221 8.4.2 Operation of GPC ................................................................222 8.4.3 Polymer Standards and Calibration Curve ......................223 8.4.4 Sample Preparation .............................................................224 8.4.5 GPC for Water-Soluble Polymers .......................................225 8.5 Gel Electrophoresis Chromatography .............................................225 8.5.1 Capillary Electrophoresis ...................................................226 8.5.2 Gel Electrophoresis ..............................................................226 8.5.3 Molecular Weight Markers .................................................229 8.5.4 DNA Electrophoresis ..........................................................229 8.6 High-Performance Liquid Chromatography ..................................229 8.6.1 WhyHPLC? ..........................................................................230 8.6.2 Isocratic Elution Versus Gradient Elution ........................231 8.6.3 Modes of HPLC ....................................................................232 8.6.4 Main Detectors of HPLC ....................................................233 8.6.5 Limitations of HPLC ...........................................................234 8.6.6 Applications of HPLC .........................................................234 8.7 Gas Chromatography .........................................................................234 8.7.1 Modes of GC .........................................................................235 8.7.2 Distribution Ratio and Temperature Effect in GC ..........235 8.7.3 Retention in GC ....................................................................236 8.7.4 Carrier Gas ............................................................................236 8.7.5 Columns and Stationary Phases ........................................236 8.7.6 Detectors ...............................................................................237 8.7.7 Factors Affecting GC Separations .....................................238 8.7.8 Features of GC ......................................................................239 8.7.9 UseofGC ..............................................................................239 8.8 Quantitative Analysis Methods .......................................................240 8.8.1 Area/Height Percent ...........................................................240 8.8.2 External Standard Method .................................................242 8.8.3 Internal Standard Method ..................................................244 References ........................................................................................................245 9 Infrared Spectroscopy and UV/Vis Spectroscopy ......................247 9.1 Infrared Radiation Spectroscopy .....................................................247 9.1.1 Molecular Vibration ............................................................247 9.1.2 Resonance .............................................................................248 9.1.3 IR Spectroscopy ...................................................................250 9.1.4 Fourier Transform Infrared Spectrometer .......................252 9.1.4.1 Interferometer .....................................................252 9.1.4.2 Fourier Transformation .....................................253 9.1.4.3 Advantages of FTIR ...........................................254 9.1.4.4 Sample Preparation ............................................255 9.1.5 Case Studies — Interactions Between Water and the Polyurethane Thermoresponsive Shape Memory Polymer .................................................................................256 9.2 Ultraviolet/Visible Spectroscopy .....................................................257 9.2.1 UV Absorption .....................................................................257 9.2.2 Beer-Lambert Law ..............................................................260 9.2.3 UV/Visible Spectra ..............................................................260 9.2.4 UV/Visible Spectroscopy ....................................................263 9.2.5 CaseStudies ..........................................................................264 References ........................................................................................................265 10 Macro and Micro Thermal Analyses ............................................267 10.1 Macro and Micro Differential Scanning Calorimetry ..................267 10.1.1 Differential Scanning Calorimetry ...................................267 10.1.2 Sample Preparation and Effect of Sample Size ................269 10.1.3 Effects of Heating Rate ........................................................270 10.1.4 Effect of Thermal History ...................................................271 10.1.5 Effect of Atmosphere ...........................................................272 10.1.6 Temperature Calibration for DSC .....................................272 10.1.7 Observation of Thermal Transitions (Using Semicrystalline Polymers as Examples): Tm, Tc, and Tg ................................................273 10.1.7.1 Melting .................................................................273 10.1.7.2 Crystallization ....................................................275 10.1.7.3 Glass Transition ..................................................276 10.1.8 Micro Differential Scanning Calorimeters ......................277 10.2 Isothermal Titration Calorimetry .....................................................282 10.3 Thermogravimetric Analysis ............................................................286 10.3.1 Principle of TGA ..................................................................286 10.3.2 Sample Preparation .............................................................287 10.3.3 Factors Affecting TGA Curves ...........................................287 10.3.3.1 Effect of Sample Holder ....................................288 10.3.3.2 Effect of Sample Mass ........................................288 10.3.3.3 Effect of Heating Rate ........................................289 10.3.3.4 Effect of Furnace Atmosphere ..........................289 10.3.4 Typical Applications of TGA ..............................................290 10.3.4.1 Thermal Stability ................................................290 10.3.4.2 Compositional Analysis ....................................290 10.3.4.3 Oxidative Stability .............................................292 References ........................................................................................................292 11 Laser Confocal Fluorescence Microscopy ....................................295 11.1 Fluorescence and Fluorescent Dyes .................................................295 11.2 Fluorescence Microscopy ..................................................................298 11.3 Laser Confocal Fluorescence Microscopy .......................................300 11.3.1 What Is Confocal? ................................................................300 11.3.2 How LCFM Works ...............................................................302 11.3.3 Optical Sectioning and 3D Imaging .................................302 11.3.4 Two-Channel LCFM ............................................................304 11.3.5 Commonly Used Fluorophores (Fluorescent Dyes) ........305 11.3.6 Photobleaching .....................................................................306 11.3.7 Resolution of LCFM and Selection of Objective Lenses ....................................................................................308 11.3.7.1 Objective Lenses .................................................309 11.3.7.2 Dry Lenses and Immersion Oil Lenses ...........310 11.3.8 Sample Preparation for LCFM ............................................311 11.3.9 Limitations of LCFM ...........................................................312 11.4 Applications of LCFM ........................................................................313 11.4.1 Imaging of Cells and Cell Structures ................................314 11.4.2 Morphological Studies of Polymer Blends .......................315 References ........................................................................................................317 Index ................................................................................................................319
any_adam_object	1
author	Zhang, Sam Li, Lin Kumar, Ashok
author_facet	Zhang, Sam Li, Lin Kumar, Ashok
author_role	aut aut aut
author_sort	Zhang, Sam
author_variant	s z sz l l ll a k ak
building	Verbundindex
bvnumber	BV035093549
callnumber-first	T - Technology
callnumber-label	TA410
callnumber-raw	TA410
callnumber-search	TA410
callnumber-sort	TA 3410
callnumber-subject	TA - General and Civil Engineering
classification_rvk	UP 9000
classification_tum	WER 700f
ctrlnum	(OCoLC)144523105 (DE-599)BVBBV035093549
dewey-full	620.1/10287
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	620 - Engineering and allied operations
dewey-raw	620.1/10287
dewey-search	620.1/10287
dewey-sort	3620.1 510287
dewey-tens	620 - Engineering and allied operations
discipline	Physik Werkstoffwissenschaften / Fertigungstechnik
edition	1st ed.
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02850nam a2200589zc 4500</leader><controlfield tag="001">BV035093549</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090708 </controlfield><controlfield tag="007">t\|</controlfield><controlfield tag="008">081010s2009 xxuad\|\| \|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a">2008030739</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781420042948</subfield><subfield code="c">alk. paper</subfield><subfield code="9">978-1-4200-4294-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1420042947</subfield><subfield code="c">alk. paper</subfield><subfield code="9">1-4200-4294-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)144523105</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV035093549</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">US</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-210</subfield><subfield code="a">DE-91G</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA410</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620.1/10287</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9000</subfield><subfield code="0">(DE-625)146451:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WER 700f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Zhang, Sam</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Materials characterization techniques</subfield><subfield code="c">Sam Zhang, Lin Li, Ashok Kumar</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton [u.a.]</subfield><subfield code="b">CRC Press</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">328 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield><subfield code="c">24 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="520" ind1="1" ind2=" "><subfield code="a">"With an emphasis on practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. The book reviews the most popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements. The text features coverage of a wide range of topics, including Auger electron spectroscopy, atomic force microscopy, transmission electron microscopy, gel electrophoresis chromatography, laser confocal scanning florescent microscopy, and UV spectroscopy."--BOOK JACKET.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Materiaalonderzoek</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Matériaux - Essais</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Wetenschappelijke technieken</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Wissenschaftliches Arbeiten</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Eigenschaft</subfield><subfield code="0">(DE-588)4151179-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Methode</subfield><subfield code="0">(DE-588)4038971-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Werkstoff</subfield><subfield code="0">(DE-588)4065579-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Eigenschaft</subfield><subfield code="0">(DE-588)4151179-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Methode</subfield><subfield code="0">(DE-588)4038971-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Li, Lin</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kumar, Ashok</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016761627&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016761627</subfield></datafield></record></collection>
id	DE-604.BV035093549
illustrated	Illustrated
indexdate	2024-12-20T13:20:00Z
institution	BVB
isbn	9781420042948 1420042947
language	English
lccn	2008030739
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-016761627
oclc_num	144523105
open_access_boolean
owner	DE-703 DE-210 DE-91G DE-BY-TUM DE-29T
owner_facet	DE-703 DE-210 DE-91G DE-BY-TUM DE-29T
physical	328 S. Ill., graph. Darst. 24 cm
publishDate	2009
publishDateSearch	2009
publishDateSort	2009
publisher	CRC Press
record_format	marc
spellingShingle	Zhang, Sam Li, Lin Kumar, Ashok Materials characterization techniques Materiaalonderzoek gtt Matériaux - Essais Wetenschappelijke technieken gtt Wissenschaftliches Arbeiten Materials Testing Werkstoff (DE-588)4065579-9 gnd Eigenschaft (DE-588)4151179-7 gnd Methode (DE-588)4038971-6 gnd Werkstoffprüfung (DE-588)4037934-6 gnd
subject_GND	(DE-588)4065579-9 (DE-588)4151179-7 (DE-588)4038971-6 (DE-588)4037934-6
title	Materials characterization techniques
title_auth	Materials characterization techniques
title_exact_search	Materials characterization techniques
title_full	Materials characterization techniques Sam Zhang, Lin Li, Ashok Kumar
title_fullStr	Materials characterization techniques Sam Zhang, Lin Li, Ashok Kumar
title_full_unstemmed	Materials characterization techniques Sam Zhang, Lin Li, Ashok Kumar
title_short	Materials characterization techniques
title_sort	materials characterization techniques
topic	Materiaalonderzoek gtt Matériaux - Essais Wetenschappelijke technieken gtt Wissenschaftliches Arbeiten Materials Testing Werkstoff (DE-588)4065579-9 gnd Eigenschaft (DE-588)4151179-7 gnd Methode (DE-588)4038971-6 gnd Werkstoffprüfung (DE-588)4037934-6 gnd
topic_facet	Materiaalonderzoek Matériaux - Essais Wetenschappelijke technieken Wissenschaftliches Arbeiten Materials Testing Werkstoff Eigenschaft Methode Werkstoffprüfung
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016761627&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT zhangsam materialscharacterizationtechniques AT lilin materialscharacterizationtechniques AT kumarashok materialscharacterizationtechniques

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