Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis:
Gespeichert in:
| Weitere beteiligte Personen: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Washington
Gov. Print. Off.
2002
|
| Schriftenreihe: | Journal of research of the National Institute of Standards and Technology
107,6 |
| Schlagwörter: | |
| Umfang: | VI S., S. 483 - 727 Ill., graph. Darst. |
Internformat
MARC
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| 245 | 1 | 0 | |a Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |c [Dale E. Newbury, special issue ed.] |
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Datensatz im Suchindex
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| author2 | Newbury, Dale E. |
| author2_role | edt |
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| author_facet | Newbury, Dale E. |
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| illustrated | Illustrated |
| indexdate | 2024-12-20T15:04:47Z |
| institution | BVB |
| language | English |
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| physical | VI S., S. 483 - 727 Ill., graph. Darst. |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Gov. Print. Off. |
| record_format | marc |
| series2 | Journal of research of the National Institute of Standards and Technology |
| spelling | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] Accuracy barriers of quantitative electron beam x-ray microanalysis Washington Gov. Print. Off. 2002 VI S., S. 483 - 727 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Journal of research of the National Institute of Standards and Technology 107,6 Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Genauigkeit (DE-588)4234398-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s Elektronenmikroskopie (DE-588)4014327-2 s Genauigkeit (DE-588)4234398-7 s DE-188 Newbury, Dale E. edt |
| spellingShingle | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Genauigkeit (DE-588)4234398-7 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4014327-2 (DE-588)4234398-7 |
| title | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_alt | Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_auth | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_exact_search | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_full | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_fullStr | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_full_unstemmed | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis [Dale E. Newbury, special issue ed.] |
| title_short | Special issue: Accuracy barriers of quantitative electron beam x-ray microanalysis |
| title_sort | special issue accuracy barriers of quantitative electron beam x ray microanalysis |
| topic | Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Genauigkeit (DE-588)4234398-7 gnd |
| topic_facet | Mikroanalyse Elektronenmikroskopie Genauigkeit |
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