Fault behavior and testability of asynchronous CMOS circuits:
Gespeichert in:
| Beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Nichtbestimmte Sprache |
| Veröffentlicht: |
Darmstadt
GMD
1993
|
| Schriftenreihe: | Arbeitspapiere der GMD
721 |
| Umfang: | 12 S. graph. Darst. : 30 cm |
Internformat
MARC
| LEADER | 00000nam a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV025995890 | ||
| 003 | DE-604 | ||
| 005 | 19960709000000.0 | ||
| 007 | t| | ||
| 008 | 960313s1993 xx d||| |||| 00||| und d | ||
| 020 | |c kart. : DM 10.00 | ||
| 035 | |a (OCoLC)75330449 | ||
| 035 | |a (DE-599)BVBBV025995890 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | |a und | ||
| 049 | |a DE-525 | ||
| 100 | 1 | |a Vierhaus, Heinrich Theodor |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Fault behavior and testability of asynchronous CMOS circuits |c Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| 264 | 1 | |a Darmstadt |b GMD |c 1993 | |
| 300 | |a 12 S. |b graph. Darst. : 30 cm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Arbeitspapiere der GMD |v 721 | |
| 700 | 1 | |a Meyer, Wolfgang |e Verfasser |4 aut | |
| 700 | 1 | |a Camposano, Raúl |e Verfasser |4 aut | |
| 830 | 0 | |a Arbeitspapiere der GMD |v 721 |w (DE-604)BV000613796 |9 721 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-020376681 | |
Datensatz im Suchindex
| _version_ | 1818970338195668992 |
|---|---|
| any_adam_object | |
| author | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl |
| author_facet | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl |
| author_role | aut aut aut |
| author_sort | Vierhaus, Heinrich Theodor |
| author_variant | h t v ht htv w m wm r c rc |
| building | Verbundindex |
| bvnumber | BV025995890 |
| ctrlnum | (OCoLC)75330449 (DE-599)BVBBV025995890 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01032nam a2200301zcb4500</leader><controlfield tag="001">BV025995890</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19960709000000.0</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">960313s1993 xx d||| |||| 00||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="c">kart. : DM 10.00</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)75330449</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025995890</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-525</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Vierhaus, Heinrich Theodor</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fault behavior and testability of asynchronous CMOS circuits</subfield><subfield code="c">Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Darmstadt</subfield><subfield code="b">GMD</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">12 S.</subfield><subfield code="b">graph. Darst. : 30 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Arbeitspapiere der GMD</subfield><subfield code="v">721</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Meyer, Wolfgang</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Camposano, Raúl</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Arbeitspapiere der GMD</subfield><subfield code="v">721</subfield><subfield code="w">(DE-604)BV000613796</subfield><subfield code="9">721</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-020376681</subfield></datafield></record></collection> |
| id | DE-604.BV025995890 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T14:34:53Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020376681 |
| oclc_num | 75330449 |
| open_access_boolean | |
| owner | DE-525 |
| owner_facet | DE-525 |
| physical | 12 S. graph. Darst. : 30 cm |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | GMD |
| record_format | marc |
| series | Arbeitspapiere der GMD |
| series2 | Arbeitspapiere der GMD |
| spelling | Vierhaus, Heinrich Theodor Verfasser aut Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. Darmstadt GMD 1993 12 S. graph. Darst. : 30 cm txt rdacontent n rdamedia nc rdacarrier Arbeitspapiere der GMD 721 Meyer, Wolfgang Verfasser aut Camposano, Raúl Verfasser aut Arbeitspapiere der GMD 721 (DE-604)BV000613796 721 |
| spellingShingle | Vierhaus, Heinrich Theodor Meyer, Wolfgang Camposano, Raúl Fault behavior and testability of asynchronous CMOS circuits Arbeitspapiere der GMD |
| title | Fault behavior and testability of asynchronous CMOS circuits |
| title_auth | Fault behavior and testability of asynchronous CMOS circuits |
| title_exact_search | Fault behavior and testability of asynchronous CMOS circuits |
| title_full | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_fullStr | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_full_unstemmed | Fault behavior and testability of asynchronous CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer ; Raul Camposano. Gesellschaft für Mathematik und Datenverarbeitung mbH. |
| title_short | Fault behavior and testability of asynchronous CMOS circuits |
| title_sort | fault behavior and testability of asynchronous cmos circuits |
| volume_link | (DE-604)BV000613796 |
| work_keys_str_mv | AT vierhausheinrichtheodor faultbehaviorandtestabilityofasynchronouscmoscircuits AT meyerwolfgang faultbehaviorandtestabilityofasynchronouscmoscircuits AT camposanoraul faultbehaviorandtestabilityofasynchronouscmoscircuits |