A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits:
Gespeichert in:
| Beteiligte Personen: | , |
|---|---|
| Format: | Buch |
| Sprache: | Nichtbestimmte Sprache |
| Veröffentlicht: |
Sankt Augustin
Gesellschaft für Mathematik und Datenverarbeitung
1993
|
| Schriftenreihe: | Arbeitspapiere der GMD
728 |
| Umfang: | 22 S. Ill. |
| ISSN: | 0723-0508 |
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| 264 | 1 | |a Sankt Augustin |b Gesellschaft für Mathematik und Datenverarbeitung |c 1993 | |
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Datensatz im Suchindex
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| author | Vierhaus, Heinrich Theodor Meyer, Wolfgang |
| author_facet | Vierhaus, Heinrich Theodor Meyer, Wolfgang |
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| id | DE-604.BV025995119 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T14:34:52Z |
| institution | BVB |
| issn | 0723-0508 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-020375993 |
| oclc_num | 917357720 |
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| owner | DE-525 |
| owner_facet | DE-525 |
| physical | 22 S. Ill. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Gesellschaft für Mathematik und Datenverarbeitung |
| record_format | marc |
| series | Arbeitspapiere der GMD |
| series2 | Arbeitspapiere der GMD |
| spelling | Vierhaus, Heinrich Theodor Verfasser aut A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer Sankt Augustin Gesellschaft für Mathematik und Datenverarbeitung 1993 22 S. Ill. txt rdacontent n rdamedia nc rdacarrier Arbeitspapiere der GMD 728 0723-0508 Meyer, Wolfgang Verfasser aut Arbeitspapiere der GMD 728 (DE-604)BV000613796 728 |
| spellingShingle | Vierhaus, Heinrich Theodor Meyer, Wolfgang A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits Arbeitspapiere der GMD |
| title | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits |
| title_auth | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits |
| title_exact_search | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits |
| title_full | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer |
| title_fullStr | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer |
| title_full_unstemmed | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits Heinrich Theodor Vierhaus ; Wolfgang Meyer |
| title_short | A comparative analysis of lddq-versus delay fault methods for defect-oriented testing of CMOS circuits |
| title_sort | a comparative analysis of lddq versus delay fault methods for defect oriented testing of cmos circuits |
| volume_link | (DE-604)BV000613796 |
| work_keys_str_mv | AT vierhausheinrichtheodor acomparativeanalysisoflddqversusdelayfaultmethodsfordefectorientedtestingofcmoscircuits AT meyerwolfgang acomparativeanalysisoflddqversusdelayfaultmethodsfordefectorientedtestingofcmoscircuits |