Thin films: stresses and mechanical properties ; symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A.
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Bibliographic Details
Other Authors: Bravman, John C. (Editor)
Format: Book
Language:English
Published: Pittsburgh [u.a.] Materials Research Soc. 1989
Series:Materials Research Society symposium proceedings 130
Physical Description:XIII, 402 S.
ISBN:1558990038