Verfügbarkeit: Semiconductor measurements and instrumentation

Semiconductor measurements and instrumentation:

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Bibliographische Detailangaben
Beteilige Person:	Runyan, Walter R. 1925- (VerfasserIn)
Format:	Buch
Sprache:	Nichtbestimmte Sprache
Veröffentlicht:	New York <<[u.a.]>> McGraw Hill 1997
Ausgabe:	2. ed.
Schlagwörter:	Halbleiter Kristallographie Mikroskopie Halbleitermesstechnik Einführung
Umfang:	X, 454 S. Ill., graph. Darst.
ISBN:	0070576971

Internformat

MARC


LEADER	00000nam a2200000 c 4500
001	BV024436949
003	DE-604
005	20090910
007	t\|
008	090924s1997 xx ad\|\| \|\|\|\| 00\|\|\| und d
020			\|a 0070576971 \|9 0-07-057697-1
035			\|a (OCoLC)833259170
035			\|a (DE-599)BVBBV024436949
040			\|a DE-604 \|b ger \|e rakwb
041			\|a und
049			\|a DE-83
082	0		\|a 621.381520287
084			\|a ZN 4800 \|0 (DE-625)157408: \|2 rvk
100	1		\|a Runyan, Walter R. \|d 1925- \|e Verfasser \|0 (DE-588)140968016 \|4 aut
245	1	0	\|a Semiconductor measurements and instrumentation \|c W. R. Runyan and T. J. Shaffner
250			\|a 2. ed.
264		1	\|a New York <<[u.a.]>> \|b McGraw Hill \|c 1997
300			\|a X, 454 S. \|b Ill., graph. Darst.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
650	0	7	\|a Halbleiter \|0 (DE-588)4022993-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Kristallographie \|0 (DE-588)4033217-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Mikroskopie \|0 (DE-588)4039238-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Halbleitermesstechnik \|0 (DE-588)4158807-1 \|2 gnd \|9 rswk-swf
655		7	\|0 (DE-588)4151278-9 \|a Einführung \|2 gnd-content
689	0	0	\|a Halbleiter \|0 (DE-588)4022993-2 \|D s
689	0	1	\|a Mikroskopie \|0 (DE-588)4039238-7 \|D s
689	0		\|8 1\p \|5 DE-604
689	1	0	\|a Halbleiter \|0 (DE-588)4022993-2 \|D s
689	1	1	\|a Kristallographie \|0 (DE-588)4033217-2 \|D s
689	1		\|8 2\p \|5 DE-604
689	2	0	\|a Halbleitermesstechnik \|0 (DE-588)4158807-1 \|D s
689	2		\|8 3\p \|5 DE-604
700	1		\|a Shaffner, Thomas J. \|e Sonstige \|4 oth
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
943	1		\|a oai:aleph.bib-bvb.de:BVB01-018413983

Datensatz im Suchindex

_version_	1818967854942257152
any_adam_object
author	Runyan, Walter R. 1925-
author_GND	(DE-588)140968016
author_facet	Runyan, Walter R. 1925-
author_role	aut
author_sort	Runyan, Walter R. 1925-
author_variant	w r r wr wrr
building	Verbundindex
bvnumber	BV024436949
classification_rvk	ZN 4800
ctrlnum	(OCoLC)833259170 (DE-599)BVBBV024436949
dewey-full	621.381520287
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.381520287
dewey-search	621.381520287
dewey-sort	3621.381520287
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
edition	2. ed.
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01852nam a2200493 c 4500</leader><controlfield tag="001">BV024436949</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090910 </controlfield><controlfield tag="007">t\|</controlfield><controlfield tag="008">090924s1997 xx ad\|\| \|\|\|\| 00\|\|\| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0070576971</subfield><subfield code="9">0-07-057697-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)833259170</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV024436949</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381520287</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4800</subfield><subfield code="0">(DE-625)157408:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Runyan, Walter R.</subfield><subfield code="d">1925-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)140968016</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor measurements and instrumentation</subfield><subfield code="c">W. R. Runyan and T. J. Shaffner</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York <<[u.a.]>></subfield><subfield code="b">McGraw Hill</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 454 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristallographie</subfield><subfield code="0">(DE-588)4033217-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleitermesstechnik</subfield><subfield code="0">(DE-588)4158807-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4151278-9</subfield><subfield code="a">Einführung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Kristallographie</subfield><subfield code="0">(DE-588)4033217-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Halbleitermesstechnik</subfield><subfield code="0">(DE-588)4158807-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shaffner, Thomas J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018413983</subfield></datafield></record></collection>
genre	(DE-588)4151278-9 Einführung gnd-content
genre_facet	Einführung
id	DE-604.BV024436949
illustrated	Illustrated
indexdate	2024-12-20T13:55:25Z
institution	BVB
isbn	0070576971
language	Undetermined
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-018413983
oclc_num	833259170
open_access_boolean
owner	DE-83
owner_facet	DE-83
physical	X, 454 S. Ill., graph. Darst.
publishDate	1997
publishDateSearch	1997
publishDateSort	1997
publisher	McGraw Hill
record_format	marc
spelling	Runyan, Walter R. 1925- Verfasser (DE-588)140968016 aut Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner 2. ed. New York <<[u.a.]>> McGraw Hill 1997 X, 454 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Halbleiter (DE-588)4022993-2 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Halbleitermesstechnik (DE-588)4158807-1 gnd rswk-swf (DE-588)4151278-9 Einführung gnd-content Halbleiter (DE-588)4022993-2 s Mikroskopie (DE-588)4039238-7 s 1\p DE-604 Kristallographie (DE-588)4033217-2 s 2\p DE-604 Halbleitermesstechnik (DE-588)4158807-1 s 3\p DE-604 Shaffner, Thomas J. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Runyan, Walter R. 1925- Semiconductor measurements and instrumentation Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd
subject_GND	(DE-588)4022993-2 (DE-588)4033217-2 (DE-588)4039238-7 (DE-588)4158807-1 (DE-588)4151278-9
title	Semiconductor measurements and instrumentation
title_auth	Semiconductor measurements and instrumentation
title_exact_search	Semiconductor measurements and instrumentation
title_full	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_fullStr	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_full_unstemmed	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_short	Semiconductor measurements and instrumentation
title_sort	semiconductor measurements and instrumentation
topic	Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd
topic_facet	Halbleiter Kristallographie Mikroskopie Halbleitermesstechnik Einführung
work_keys_str_mv	AT runyanwalterr semiconductormeasurementsandinstrumentation AT shaffnerthomasj semiconductormeasurementsandinstrumentation

Verfügbarkeit

MARC

Datensatz im Suchindex

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