Verfügbarkeit: A probabilistic analysis of test-response compaction

A probabilistic analysis of test-response compaction:

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Bibliographische Detailangaben
Beteiligte Personen:	Pilarski, Slawomir (VerfasserIn), Kameda, Tiko (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1995
Schlagwörter:	Electronic circuits > Testing Fault-tolerant computing Probabilities Fehlertoleranz Elektronische Schaltung Datenverarbeitung Wahrscheinlichkeit Test
Beschreibung:	Literaturverz. S. 89 - 94
Umfang:	X, 95 S. zahlr. graph. Darst.
ISBN:	0818665327

Internformat

MARC


LEADER	00000nam a2200000zc 4500
001	BV021932549
003	DE-604
005	20040301000000.0
007	t\|
008	961205s1995 xx d\|\|\| \|\|\|\| 00\|\|\| eng d
020			\|a 0818665327 \|9 0-8186-6532-7
035			\|a (OCoLC)30700420
035			\|a (DE-599)BVBBV021932549
040			\|a DE-604 \|b ger
041	0		\|a eng
049			\|a DE-706
050		0	\|a TK7867
082	0		\|a 621.3815/48/015192 \|2 20
100	1		\|a Pilarski, Slawomir \|e Verfasser \|4 aut
245	1	0	\|a A probabilistic analysis of test-response compaction \|c Slawomir Pilarski and Tiko Kameda
264		1	\|a Los Alamitos, Calif. [u.a.] \|b IEEE Computer Soc. Press \|c 1995
300			\|a X, 95 S. \|b zahlr. graph. Darst.
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
500			\|a Literaturverz. S. 89 - 94
650		4	\|a Electronic circuits \|x Testing
650		4	\|a Fault-tolerant computing
650		4	\|a Probabilities
650	0	7	\|a Fehlertoleranz \|0 (DE-588)4123192-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronische Schaltung \|0 (DE-588)4113419-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Datenverarbeitung \|0 (DE-588)4011152-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Wahrscheinlichkeit \|0 (DE-588)4137007-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Test \|0 (DE-588)4059549-3 \|2 gnd \|9 rswk-swf
689	0	0	\|a Datenverarbeitung \|0 (DE-588)4011152-0 \|D s
689	0		\|5 DE-604
689	1	0	\|a Test \|0 (DE-588)4059549-3 \|D s
689	1		\|5 DE-604
689	2	0	\|a Elektronische Schaltung \|0 (DE-588)4113419-9 \|D s
689	2		\|5 DE-604
689	3	0	\|a Fehlertoleranz \|0 (DE-588)4123192-2 \|D s
689	3		\|5 DE-604
689	4	0	\|a Wahrscheinlichkeit \|0 (DE-588)4137007-7 \|D s
689	4		\|5 DE-604
700	1		\|a Kameda, Tiko \|e Verfasser \|4 aut
943	1		\|a oai:aleph.bib-bvb.de:BVB01-015147704

Datensatz im Suchindex

_version_	1818963435200708608
any_adam_object
author	Pilarski, Slawomir Kameda, Tiko
author_facet	Pilarski, Slawomir Kameda, Tiko
author_role	aut aut
author_sort	Pilarski, Slawomir
author_variant	s p sp t k tk
building	Verbundindex
bvnumber	BV021932549
callnumber-first	T - Technology
callnumber-label	TK7867
callnumber-raw	TK7867
callnumber-search	TK7867
callnumber-sort	TK 47867
callnumber-subject	TK - Electrical and Nuclear Engineering
ctrlnum	(OCoLC)30700420 (DE-599)BVBBV021932549
dewey-full	621.3815/48/015192
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815/48/015192
dewey-search	621.3815/48/015192
dewey-sort	3621.3815 248 515192
dewey-tens	620 - Engineering and allied operations
discipline	Elektrotechnik / Elektronik / Nachrichtentechnik
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01758nam a2200517zc 4500</leader><controlfield tag="001">BV021932549</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20040301000000.0</controlfield><controlfield tag="007">t\|</controlfield><controlfield tag="008">961205s1995 xx d\|\|\| \|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818665327</subfield><subfield code="9">0-8186-6532-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)30700420</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV021932549</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7867</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/48/015192</subfield><subfield code="2">20</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pilarski, Slawomir</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A probabilistic analysis of test-response compaction</subfield><subfield code="c">Slawomir Pilarski and Tiko Kameda</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, 95 S.</subfield><subfield code="b">zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturverz. S. 89 - 94</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fault-tolerant computing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Probabilities</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Wahrscheinlichkeit</subfield><subfield code="0">(DE-588)4137007-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Elektronische Schaltung</subfield><subfield code="0">(DE-588)4113419-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Wahrscheinlichkeit</subfield><subfield code="0">(DE-588)4137007-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kameda, Tiko</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-015147704</subfield></datafield></record></collection>
id	DE-604.BV021932549
illustrated	Illustrated
indexdate	2024-12-20T12:45:10Z
institution	BVB
isbn	0818665327
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-015147704
oclc_num	30700420
open_access_boolean
owner	DE-706
owner_facet	DE-706
physical	X, 95 S. zahlr. graph. Darst.
publishDate	1995
publishDateSearch	1995
publishDateSort	1995
publisher	IEEE Computer Soc. Press
record_format	marc
spelling	Pilarski, Slawomir Verfasser aut A probabilistic analysis of test-response compaction Slawomir Pilarski and Tiko Kameda Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1995 X, 95 S. zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 89 - 94 Electronic circuits Testing Fault-tolerant computing Probabilities Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Datenverarbeitung (DE-588)4011152-0 gnd rswk-swf Wahrscheinlichkeit (DE-588)4137007-7 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Datenverarbeitung (DE-588)4011152-0 s DE-604 Test (DE-588)4059549-3 s Elektronische Schaltung (DE-588)4113419-9 s Fehlertoleranz (DE-588)4123192-2 s Wahrscheinlichkeit (DE-588)4137007-7 s Kameda, Tiko Verfasser aut
spellingShingle	Pilarski, Slawomir Kameda, Tiko A probabilistic analysis of test-response compaction Electronic circuits Testing Fault-tolerant computing Probabilities Fehlertoleranz (DE-588)4123192-2 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Datenverarbeitung (DE-588)4011152-0 gnd Wahrscheinlichkeit (DE-588)4137007-7 gnd Test (DE-588)4059549-3 gnd
subject_GND	(DE-588)4123192-2 (DE-588)4113419-9 (DE-588)4011152-0 (DE-588)4137007-7 (DE-588)4059549-3
title	A probabilistic analysis of test-response compaction
title_auth	A probabilistic analysis of test-response compaction
title_exact_search	A probabilistic analysis of test-response compaction
title_full	A probabilistic analysis of test-response compaction Slawomir Pilarski and Tiko Kameda
title_fullStr	A probabilistic analysis of test-response compaction Slawomir Pilarski and Tiko Kameda
title_full_unstemmed	A probabilistic analysis of test-response compaction Slawomir Pilarski and Tiko Kameda
title_short	A probabilistic analysis of test-response compaction
title_sort	a probabilistic analysis of test response compaction
topic	Electronic circuits Testing Fault-tolerant computing Probabilities Fehlertoleranz (DE-588)4123192-2 gnd Elektronische Schaltung (DE-588)4113419-9 gnd Datenverarbeitung (DE-588)4011152-0 gnd Wahrscheinlichkeit (DE-588)4137007-7 gnd Test (DE-588)4059549-3 gnd
topic_facet	Electronic circuits Testing Fault-tolerant computing Probabilities Fehlertoleranz Elektronische Schaltung Datenverarbeitung Wahrscheinlichkeit Test
work_keys_str_mv	AT pilarskislawomir aprobabilisticanalysisoftestresponsecompaction AT kamedatiko aprobabilisticanalysisoftestresponsecompaction

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Datensatz im Suchindex

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