On the automatic generation of test patterns from mixed-level hardware description:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
1989
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| Schlagwörter: | |
| Beschreibung: | Kaiserslautern, Univ., Diss., 1989 |
| Umfang: | 16, 256 S. graph. Darst. |
Internformat
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Datensatz im Suchindex
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| author | Wodtko, Andrea |
| author_facet | Wodtko, Andrea |
| author_role | aut |
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| id | DE-604.BV021915622 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T12:44:46Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015130793 |
| oclc_num | 46213022 |
| open_access_boolean | |
| owner | DE-706 |
| owner_facet | DE-706 |
| physical | 16, 256 S. graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| record_format | marc |
| spelling | Wodtko, Andrea Verfasser aut On the automatic generation of test patterns from mixed-level hardware description by Andrea Wodtko 1989 16, 256 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Kaiserslautern, Univ., Diss., 1989 Test (DE-588)4059549-3 gnd rswk-swf Mustererkennung (DE-588)4040936-3 gnd rswk-swf Algorithmus (DE-588)4001183-5 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Algorithmus (DE-588)4001183-5 s DE-604 Mustererkennung (DE-588)4040936-3 s Test (DE-588)4059549-3 s VLSI (DE-588)4117388-0 s |
| spellingShingle | Wodtko, Andrea On the automatic generation of test patterns from mixed-level hardware description Test (DE-588)4059549-3 gnd Mustererkennung (DE-588)4040936-3 gnd Algorithmus (DE-588)4001183-5 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4059549-3 (DE-588)4040936-3 (DE-588)4001183-5 (DE-588)4117388-0 |
| title | On the automatic generation of test patterns from mixed-level hardware description |
| title_auth | On the automatic generation of test patterns from mixed-level hardware description |
| title_exact_search | On the automatic generation of test patterns from mixed-level hardware description |
| title_full | On the automatic generation of test patterns from mixed-level hardware description by Andrea Wodtko |
| title_fullStr | On the automatic generation of test patterns from mixed-level hardware description by Andrea Wodtko |
| title_full_unstemmed | On the automatic generation of test patterns from mixed-level hardware description by Andrea Wodtko |
| title_short | On the automatic generation of test patterns from mixed-level hardware description |
| title_sort | on the automatic generation of test patterns from mixed level hardware description |
| topic | Test (DE-588)4059549-3 gnd Mustererkennung (DE-588)4040936-3 gnd Algorithmus (DE-588)4001183-5 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Test Mustererkennung Algorithmus VLSI |
| work_keys_str_mv | AT wodtkoandrea ontheautomaticgenerationoftestpatternsfrommixedlevelhardwaredescription |