Verfügbarkeit: Transmission electron microscopy | Technische Universität München

Transmission electron microscopy: physics of image formation

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Bibliographische Detailangaben
Beteiligte Personen:	Reimer, Ludwig 1928- (VerfasserIn), Kohl, Helmut 1955- (VerfasserIn)
Format:	Buch
Sprache:	Deutsch
Veröffentlicht:	New York, NY Springer 2008
Ausgabe:	5. ed.
Schriftenreihe:	Springer series in optical sciences 36
Schlagwörter:	Transmission electron microscopy Durchstrahlungselektronenmikroskopie
Links:	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010511092&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
Umfang:	XVI, 587 S. Ill., graph. Darst.
ISBN:	9780387400938 9780387347585

Internformat

MARC


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Datensatz im Suchindex

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adam_text	Contents Introduction ............................................... 1 1.1 Transmission Electron Microscopy ......................... 1 1.1.1 Conventional Transmission Electron Microscopy ....... 1 1.1.2 High-Resolution Electron Microscopy ................ З 1.1.3 Analytical Electron Microscopy ..................... 5 1.1.4 Energy-Filtering Electron Microscopy ................ 7 1.1.5 High-Voltage Electron Microscopy ................... 7 1.1.6 Dedicated Scanning Transmission Electron Microscopy ....................................... 9 1.2 Alternative Types of Electron Microscopy .................. 10 1.2.1 Emission Electron Microscopy ....................... 10 1.2.2 Reflection Electron Microscopy ...................... 11 1.2.3 Mirror Electron Microscopy ......................... 11 1.2.4 Scanning Electron Microscopy ...................... 12 1.2.5 X-ray and Auger-Electron Microanałysis ............. 14 1.2.6 Scanning-Probe Microscopy ......................... 14 Particle Optics of Electrons ................................ 17 2.1 Acceleration and Deflection of Electrons .................... 17 2.1.1 Relativistic Mechanics of Electron Acceleration ........ 17 2.1.2 Deflection by Magnetic and Electric Fields ............ 20 2.2 Electron Lenses ......................................... 22 2.2.1 Electron Trajectories in a Magnetic Lens Field ........ 22 2.2.2 Optics of an Electron Lens with a Bell-Shaped Field ... 25 2.2.3 Special Electron Lenses ............................ 29 2.3 Lens Aberrations ........................................ 31 2.3.1 Classification of Lens Aberrations ................... 31 2.3.2 Spherical Aberration ............................... 32 2.3.3 Astigmatism and Field Curvature ................... 34 2.3.4 Distortion ........................................ 36 2.3.5 Coma ............................................ 37 Contents 2.3.6 Anisotropie Aberrations............................ 38 2.3.7 Chromatic Aberration............................. 38 2.4 Correction of Aberrations and Microscope Alignment ........ 40 2.4.1 Correction of Astigmatism .......................... 40 2.4.2 Correction of Spherical and Chromatic Aberrations .... 42 2.4.3 Microscope Alignment ............................. 43 Wave Optics of Electrons .................................. 45 3.1 Electron Waves and Phase Shifts .......................... 45 3.1.1 De Broglie Waves ................................. 45 3.1.2 Probability Density and Wave Packets ............... 49 3.1.3 Electron-Optical Refractive Index and the Schrödinger Equation ....................... 51 3.1.4 Electron Interferometry and Coherence ............... 53 3.2 Fresnel and Fraunhofer Diffraction......................... 55 3.2.1 Huygens Principle and Fresnel Diffraction ............ 55 3.2.2 Fresnel Fringes .................................... 59 3.2.3 Fraunhofer Diffraction ............................. 61 3.2.4 Mathematics of Fourier Transforms .................. 63 3.3 Wave-Optical Formulation of Imaging ...................... 70 3.3.1 Wave Aberration of an Electron Lens ................ 70 3.3.2 Wave-Optical Theory of Imaging .................... 73 Elements of a Transmission Electron Microscope .......... 77 4.1 Electron Guns .......................................... 78 4.1.1 Physics of Electron Emission ........................ 78 4.1.2 Energy Spread .................................... 81 4.1.3 Gun Brightness ................................... 82 4.1.4 Thermionic Electron Guns .......................... 84 4.1.5 Schottky Emission Guns ........................... 88 4.1.6 Field-Emission Guns ............................... 89 4.2 The Illumination System of а ТЕМ ........................ 90 4.2.1 Condenser-Lens System ............................ 90 4.2.2 Electron-Probe Formation .......................... 93 4.2.3 Illumination with an Objective Prefield Lens .......... 96 4.3 Specimens .............................................. 98 4.3.1 Useful Specimen Thickness ......................... 98 4.3.2 Specimen Mounting ................................ 99 4.3.3 Specimen Manipulation ............................100 4.4 The Imaging System of а ТЕМ ............................103 4.4.1 Objective Lens ....................................103 4.4.2 Imaging Modes of а ТЕМ ..........................104 4.4.3 Magnification and Calibration .......................107 4.4.4 Depth of Image and Depth of Focus .................108 4.5 Scanning Transmission Electron Microscopy (STEM) ........109 Contents XI 4.5.1 Scanning Transmission Mode of ТЕМ ................109 4.5.2 Dedicated STEM ..................................112 4.5.3 Theorem of Reciprocity ............................113 4.6 Electron Spectrometers and Imaging Energy Filters ..........115 4.6.1 Postcolumn Prism Spectrometer .....................116 4.6.2 Wien Filter .......................................119 4.6.3 Imaging Energy Filter .............................119 4.6.4 Operating Modes with Energy Filtering ..............124 4.7 Image Recording and Electron Detection ...................126 4.7.1 Fluorescent Screens ................................126 4.7.2 Photographic Emulsions ............................127 4.7.3 Imaging Plate .....................................131 4.7.4 Detector Noise and Detection Quantum Efficiency .....132 4.7.5 Low-Light-Level and Charge-Coupled-Device (CCD) Cameras ...................................134 4.7.6 Semiconductor and Scintillation Detectors ............138 4.7.7 Faraday Cages ....................................139 Electron—Specimen Interactions ............................141 5.1 Elastic Scattering ........................................141 5.1.1 Cross Section and Mean Free Path ..................141 5.1.2 Energy Transfer in an Electron-Nucleus Collision ......143 5.1.3 Elastic Differential Cross Section for Small-Angle Scattering ........................................146 5.1.4 Total Elastic Cross Section .........................152 5.2 Inelastic Scattering ......................................153 5.2.1 Electron-Specimen Interactions with Energy Loss .....153 5.2.2 Differential Cross Section for Single-Electron Excitation ........................................156 5.2.3 Bethe Surface and Compton Scattering ...............158 5.2.4 Approximation for the Total Inelastic Cross Section .... 162 5.2.5 Dielectric Theory and Plasmon Losses in Solids .......163 5.2.6 Surface-Plasmon Losses ............................171 5.3 Energy Losses by Inner-Shell Ionization ....................174 5.3.1 Position and Shape of Ionization Edges ..............174 5.3.2 Inner-Shell Ionization Cross Sections .................177 5.3.3 Energy-Loss Near-Edge Structure (ELNES) ...........179 5.3.4 Extended Energy-Loss Fine Structure (EXELFS) ......182 5.3.5 Linear and Circular Dichroism ......................183 5.4 Multiple-Scattering Effects ................................184 5.4.1 Angular Distribution of Scattered Electrons ...........184 5.4.2 Energy Distribution of Transmitted Electrons .........186 5.4.3 Electron-Probe Broadening by Multiple Scattering .....188 5.4.4 Electron Diffusion, Backscattering, and Secondary-Electron Emission ....................192 XII Contents 6 Scattering and Phase Contrast for Amorphous Specimens .................................................195 6.1 Scattering Contrast ......................................196 6.1.1 Transmission in the Bright-Field Mode ...............196 6.1.2 Dark-Field Mode ..................................201 6.1.3 Examples of Scattering Contrast ....................202 6.1.4 Improvement of Scattering Contrast by Energy Filtering .........................................205 6.1.5 Scattering Contrast in the STEM Mode ..............208 6.1.6 Measurement of Mass Thickness and Total Mass ......209 6.2 Phase Contrast ..........................................211 6.2.1 The Origin of Phase Contrast .......................211 6.2.2 Defocusing Phase Contrast of Supporting Films .......212 6.2.3 Examples of Phase Contrast ........................215 6.2.4 Theoretical Methods for Calculating Phase Contrast ... 216 6.2.5 Imaging of a Scattering Point Object ................218 6.2.6 Relation between Phase and Scattering Contrast ......220 6.3 Imaging of Single Atoms .................................221 6.3.1 Imaging of Single Atoms in ТЕМ ....................221 6.3.2 Imaging of Single Atoms in the STEM Mode ..........225 6.4 Contrast-Transfer Function (CTF) .........................228 6.4.1 The CTF for Amplitude and Phase Specimens ........228 6.4.2 Influence of Energy Spread and Illumination Aperture .........................................230 6.4.3 The CTF for Tilted-Beam and Hollow-Cone Illumination ......................................233 6.4.4 Contrast Transfer in STEM .........................236 6.4.5 Phase Contrast by Inelastically Scattered Electrons .... 237 6.4.6 Improvement of the CTF Inside the Microscope .......238 6.4.7 Control of the CTF by Optical or Digital Fourier Transform ........................................238 6.5 Electron Holography .....................................241 6.5.1 Fresnel and Fraunhofer In-Line Holography ...........241 6.5.2 Single-Sideband Holography ........................244 6.5.3 Off-Axis Holography ...............................245 6.5.4 Reconstruction of Off-Axis Holograms ................246 6.6 Image Restoration and Specimen Reconstruction ............249 6.6.1 General Aspects ...................................249 6.6.2 Methods of Optical Analog Filtering .................250 6.6.3 Digital Image Restoration ..........................252 6.6.4 Alignment by Cross-Correlation .....................254 6.6.5 Averaging of Periodic and Aperiodic Structures .......255 6.7 Three-Dimensional Reconstruction .........................258 6.7.1 Stereometry ......................................258 6.7.2 Electron Tomography ..............................259 Contents XIII 6.8 Lorentz Microscopy ......................................262 6.8.1 Lorentz Microscopy and Presnel Diffraction ...........262 6.8.2 Imaging Modes of Lorentz Microscopy ...............264 6.8.3 Imaging of Electrostatic Specimen Fields .............270 Theory of Electron Diffraction .............................273 7.1 Fundamentals of Crystallography ..........................274 7.1.1 Bravais Lattice and Lattice Planes ...................274 7.1.2 The Reciprocal Lattice .............................279 7.1.3 Construction of Laue Zones .........................282 7.2 Kinematical Theory of Electron Diffraction .................283 7.2.1 Bragg Condition and Ewald Sphere ..................283 7.2.2 Structure Amplitude and Lattice Amplitude ..........285 7.2.3 Column Approximation ............................289 7.3 Dynamical Theory of Electron Diffraction ..................292 7.3.1 Limitations of the Kinematical Theory ...............292 7.3.2 Formulation of the Dynamical Theory as a System of Differential Equations ...........................293 7.3.3 Formulation of the Dynamical Theory as an Eigenvalue Problem ..........................294 7.3.4 Discussion of the Two-Beam Case ...................298 7.4 Dynamical Theory Including Absorption ...................302 7.4.1 Inelastic-Scattering Processes in Crystals .............302 7.4.2 Absorption of the Bloch-Wave Field .................306 7.4.3 Dynamical η -Beam Theory .........................311 7.4.4 The Bethe Dynamical Potential and the Critical Voltage Effect .....................................313 7.5 Intensity Distribution in Diffraction Patterns ................317 7.5.1 Diffraction at Amorphous Specimens .................317 7.5.2 Intensity of Debye-Scherrer Rings ...................318 7.5.3 Influence of Thermal Diffuse Scattering ..............321 7.5.4 Kikuchi Lines and Bands ...........................323 7.5.5 Electron Spectroscopic Diffraction ...................326 Electron-Diffraction Modes and Applications ..............329 8.1 Electron-Diffraction Modes ...............................329 8.1.1 Selected-Area Electron Diffraction (SAED) ...........329 8.1.2 Electron Diffraction Using a Rocking Beam ...........331 8.1.3 Electron Diffraction Using a Stationary Electron Probe ............................................332 8.1.4 Electron Diffraction Using a Rocking Electron Probe. .. 336 8.1.5 Further Diffraction Modes in ТЕМ ..................338 8.2 Some Uses of Diffraction Patterns with Bragg Reflections .....342 8.2.1 Lattice-Plane Spacings .............................342 8.2.2 Texture Diagrams .................................343 XIV Contents 8.2.3 Crystal Structure ..................................345 8.2.4 Crystal Orientation ................................347 8.2.5 Examples of Extra Spots and Streaks ................349 8.3 Convergent-Beam Electron Diffraction (CBED) .............352 8.3.1 Determination of Point and Space Groups ............352 8.3.2 Determination of Foil Thickness .....................352 8.3.3 Charge-Density Distributions .......................353 8.3.4 High-Order Laue Zone (HOLZ) Patterns .............354 8.3.5 HOLZ Lines ......................................355 8.3.6 Large-Angle CBED ................................357 9 Imaging of Crystalline Specimens and Their Defects .......359 9.1 Diffraction Contrast of Crystals Free of Defects ..............360 9.1.1 Edge and Bend Contours ...........................360 9.1.2 Dark-Field Imaging ................................362 9.1.3 Moiré Fringes .....................................365 9.1.4 The STEM Mode and Multibeam Imaging ............367 9.1.5 Energy Filtering of Diffraction Contrast ..............369 9.1.6 Transmission of Crystalline Specimens ...............370 9.2 Calculation of Diffraction Contrast of Lattice Defects ........373 9.2.1 Kinematical Theory and the Howie-Whelan Equations ........................................373 9.2.2 Matrix-Multiplication Method ......................375 9.2.3 Bloch-Wave Method ...............................376 9.3 Planar Lattice Faults ....................................378 9.3.1 Kinematical Theory of Stacking-Fault Contrast .......378 9.3.2 Dynamical Theory of Stacking-Fault Contrast .........379 9.3.3 Antiphase and Other Boundaries ....................383 9.4 Dislocations ............................................385 9.4.1 Kinematical Theory of Dislocation Contrast ..........385 9.4.2 Dynamical Effects in Dislocation Images .............390 9.4.3 Weak-Beam Imaging ...............................391 9.4.4 Determination of the Burgers Vector .................394 9.5 Lattice Defects of Small Dimensions .......................396 9.5.1 Coherent and Incoherent Precipitates ................396 9.5.2 Defect Clusters ....................................398 9.6 High-Resolution Electron Microscopy (HREM) of Crystals ___400 9.6.1 Lattice-Plane Fringes ..............................400 9.6.2 General Aspects of Crystal-Structure Imaging .........402 9.6.3 Methods for Calculating Lattice-Image Contrast .......405 9.6.4 Simulation, Matching, and Reconstruction of Crystal Images .................................407 9.6.5 Measurement of Atomic Displacements in HREM ......409 9.6.6 Crystal-Structure Imaging with a Scanning Transmission Electron Microscope ...................411 Contents XV 9.7 Imaging of Atomic Surface Steps and Structures .............412 9.7.1 Imaging of Surface Steps in Transmission .............412 9.7.2 Reflection Electron Microscopy ......................416 9.7.3 Surface-Profile Imaging ............................418 10 Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy ..............................................419 10.1 X-ray and Auger-Electron Emission ........................419 10.1.1 X-ray Continuum ..................................419 10.1.2 Characteristic X-ray and Auger-Electron Emission .....421 10.2 X-ray Microanalysis in a Transmission Electron Microscope ... 425 10.2.1 Wavelength-Dispersive Spectrometry .................425 10.2.2 Energy-Dispersive Spectrometry (EDS) ..............427 10.2.3 X-ray Emission from Bulk Specimens and ZAF Correction ........................................431 10.2.4 X-ray Microanalysis of Thin Specimens ..............434 10.2.5 X-ray Microanalysis of Organic Specimens ............436 10.3 Electron Energy-Loss Spectroscopy ........................437 10.3.1 Recording of Electron Energy-Loss Spectra ...........437 10.3.2 Kramers-Kronig Relation ..........................439 10.3.3 Background Fitting and Subtraction .................441 10.3.4 Deconvolution ....................................442 10.3.5 Elemental Analysis by Inner-Shell Ionizations .........444 10.4 Element-Distribution Images ..............................447 10.4.1 Elemental Mapping by Х -Rays...................... 447 10.4.2 Element-Distribution Images Formed by Electron Spectroscopie Imaging .............................448 10.4.3 Three-Window Method ............................449 10.4.4 White-Line Method ................................450 10.4.5 Correction of Scattering Contrast ....................450 10.5 Limitations of Elemental Analysis .........................452 10.5.1 Specimen Thickness ...............................452 10.5.2 Radiation Damage and Loss of Elements .............452 10.5.3 Counting Statistics and Sensitivity ..................453 10.5.4 Resolution and Detection Limits for Electron Spectroscopie Imaging .............................456 11 Specimen Damage by Electron Irradiation .................459 11.1 Specimen Heating .......................................459 11.1.1 Methods of Measuring Specimen Temperature ........459 11.1.2 Generation of Heat by Electron Irradiation ...........461 11.1.3 Calculation of Specimen Temperature ................463 11.2 Radiation Damage of Organic Specimens ...................466 11.2.1 Elementary Damage Processes in Organic Specimens. .. 466 11.2.2 Quantitative Methods of Measuring Damage Effects ... 470 XVI Contents 11.2.3 Methods of Reducing Radiation Damage .............477 11.2.4 Radiation Damage and High Resolution ..............479 11.3 Radiation Damage of Inorganic Specimens ..................480 11.3.1 Damage by Electron Excitation .....................480 11.3.2 Radiation Damage by Knock-On Collisions ...........482 11.4 Contamination ..........................................484 11.4.1 Origin and Sources of Contamination ................484 11.4.2 Methods for Decreasing Contamination ..............485 11.4.3 Dependence of Contamination on Irradiation Conditions .......................................486 References .....................................................491 Index ..........................................................575
any_adam_object	1
author	Reimer, Ludwig 1928- Kohl, Helmut 1955-
author_GND	(DE-588)13230130X (DE-588)137715617
author_facet	Reimer, Ludwig 1928- Kohl, Helmut 1955-
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illustrated	Illustrated
indexdate	2024-12-20T11:19:22Z
institution	BVB
isbn	9780387400938 9780387347585
language	German
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-010511092
oclc_num	234146401
open_access_boolean
owner	DE-703 DE-384 DE-29T DE-1050 DE-91G DE-BY-TUM DE-83 DE-11 DE-355 DE-BY-UBR DE-20
owner_facet	DE-703 DE-384 DE-29T DE-1050 DE-91G DE-BY-TUM DE-83 DE-11 DE-355 DE-BY-UBR DE-20
physical	XVI, 587 S. Ill., graph. Darst.
publishDate	2008
publishDateSearch	2008
publishDateSort	2008
publisher	Springer
record_format	marc
series	Springer series in optical sciences
series2	Springer series in optical sciences
spellingShingle	Reimer, Ludwig 1928- Kohl, Helmut 1955- Transmission electron microscopy physics of image formation Springer series in optical sciences Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd
subject_GND	(DE-588)4215608-7
title	Transmission electron microscopy physics of image formation
title_auth	Transmission electron microscopy physics of image formation
title_exact_search	Transmission electron microscopy physics of image formation
title_full	Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl
title_fullStr	Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl
title_full_unstemmed	Transmission electron microscopy physics of image formation L. Reimer ; H. Kohl
title_short	Transmission electron microscopy
title_sort	transmission electron microscopy physics of image formation
title_sub	physics of image formation
topic	Transmission electron microscopy Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd
topic_facet	Transmission electron microscopy Durchstrahlungselektronenmikroskopie
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=010511092&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
volume_link	(DE-604)BV000000237
work_keys_str_mv	AT reimerludwig transmissionelectronmicroscopyphysicsofimageformation AT kohlhelmut transmissionelectronmicroscopyphysicsofimageformation

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