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Integrated circuit failure analysis: a guide to preparation techniques

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Bibliographische Detailangaben
Beteilige Person:	Beck, Friedrich (VerfasserIn)
Format:	Buch
Sprache:	Englisch Deutsch
Veröffentlicht:	Chichester [u.a.] Wiley 1998
Schriftenreihe:	Wiley series in quality and reliability engineering
Schlagwörter:	Semiconductors > Failures Semiconductors > Testing Präparation Integrierte Schaltung Fehlererkennung Fehleranalyse Halbleiterschaltung
Umfang:	XIV, 173 S. Ill.
ISBN:	0471974013

Internformat

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Datensatz im Suchindex

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illustrated	Illustrated
indexdate	2024-12-20T10:33:06Z
institution	BVB
isbn	0471974013
language	English German
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oclc_num	36510050
open_access_boolean
owner	DE-91 DE-BY-TUM DE-706
owner_facet	DE-91 DE-BY-TUM DE-706
physical	XIV, 173 S. Ill.
publishDate	1998
publishDateSearch	1998
publishDateSort	1998
publisher	Wiley
record_format	marc
series2	Wiley series in quality and reliability engineering
spellingShingle	Beck, Friedrich Integrated circuit failure analysis a guide to preparation techniques Semiconductors Failures Semiconductors Testing Präparation (DE-588)4130471-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Fehleranalyse (DE-588)4016608-9 gnd Halbleiterschaltung (DE-588)4158811-3 gnd
subject_GND	(DE-588)4130471-8 (DE-588)4027242-4 (DE-588)4133764-5 (DE-588)4016608-9 (DE-588)4158811-3
title	Integrated circuit failure analysis a guide to preparation techniques
title_alt	Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen
title_auth	Integrated circuit failure analysis a guide to preparation techniques
title_exact_search	Integrated circuit failure analysis a guide to preparation techniques
title_full	Integrated circuit failure analysis a guide to preparation techniques Friedrich Beck
title_fullStr	Integrated circuit failure analysis a guide to preparation techniques Friedrich Beck
title_full_unstemmed	Integrated circuit failure analysis a guide to preparation techniques Friedrich Beck
title_short	Integrated circuit failure analysis
title_sort	integrated circuit failure analysis a guide to preparation techniques
title_sub	a guide to preparation techniques
topic	Semiconductors Failures Semiconductors Testing Präparation (DE-588)4130471-8 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Fehlererkennung (DE-588)4133764-5 gnd Fehleranalyse (DE-588)4016608-9 gnd Halbleiterschaltung (DE-588)4158811-3 gnd
topic_facet	Semiconductors Failures Semiconductors Testing Präparation Integrierte Schaltung Fehlererkennung Fehleranalyse Halbleiterschaltung
work_keys_str_mv	AT beckfriedrich praparationstechnikenfurdiefehleranalyseanintegriertenhalbleiterschaltungen AT beckfriedrich integratedcircuitfailureanalysisaguidetopreparationtechniques

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