Burn-in testing: its quantification and optimization
Gespeichert in:
| Beteiligte Personen: | , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Upper Saddle River, NJ
Prentice Hall
1997
|
| Schriftenreihe: | Reliability engineering
|
| Schlagwörter: | |
| Umfang: | XXVIII, 668 S. graph. Darst. |
| ISBN: | 0133242110 |
Internformat
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Datensatz im Suchindex
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| author | Kececioglu, Dimitri Sun, Feng-Bin |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV011936078 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T10:21:21Z |
| institution | BVB |
| isbn | 0133242110 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008068183 |
| oclc_num | 36727551 |
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| physical | XXVIII, 668 S. graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Prentice Hall |
| record_format | marc |
| series2 | Reliability engineering |
| spelling | Kececioglu, Dimitri Verfasser aut Burn-in testing its quantification and optimization Dimitri Kececioglu ; Feng-Bin Sun Upper Saddle River, NJ Prentice Hall 1997 XXVIII, 668 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Reliability engineering Durée de vie (ingénierie) - Essais ram Essais accélérés (technologie) ram Electronic apparatus and appliances Testing Environmental testing Sun, Feng-Bin Verfasser aut |
| spellingShingle | Kececioglu, Dimitri Sun, Feng-Bin Burn-in testing its quantification and optimization Durée de vie (ingénierie) - Essais ram Essais accélérés (technologie) ram Electronic apparatus and appliances Testing Environmental testing |
| title | Burn-in testing its quantification and optimization |
| title_auth | Burn-in testing its quantification and optimization |
| title_exact_search | Burn-in testing its quantification and optimization |
| title_full | Burn-in testing its quantification and optimization Dimitri Kececioglu ; Feng-Bin Sun |
| title_fullStr | Burn-in testing its quantification and optimization Dimitri Kececioglu ; Feng-Bin Sun |
| title_full_unstemmed | Burn-in testing its quantification and optimization Dimitri Kececioglu ; Feng-Bin Sun |
| title_short | Burn-in testing |
| title_sort | burn in testing its quantification and optimization |
| title_sub | its quantification and optimization |
| topic | Durée de vie (ingénierie) - Essais ram Essais accélérés (technologie) ram Electronic apparatus and appliances Testing Environmental testing |
| topic_facet | Durée de vie (ingénierie) - Essais Essais accélérés (technologie) Electronic apparatus and appliances Testing Environmental testing |
| work_keys_str_mv | AT kececiogludimitri burnintestingitsquantificationandoptimization AT sunfengbin burnintestingitsquantificationandoptimization |