Verfügbarkeit: Semiconductor measurements and instrumentation

Semiconductor measurements and instrumentation:

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Bibliographische Detailangaben
Beteiligte Personen:	Runyan, Walter R. 1925- (VerfasserIn), Shaffner, Thomas J. (VerfasserIn)
Format:	Buch
Sprache:	Englisch
Veröffentlicht:	New York [u.a.] McGraw-Hill 1998
Ausgabe:	2. ed.
Schlagwörter:	Physical measurements Semiconductors Mikroskopie Halbleitermesstechnik Kristallographie Halbleiter Einführung
Umfang:	X, 454 S. Ill., graph. Darst.
ISBN:	0070576971

Internformat

MARC


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650		4	\|a Physical measurements
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Datensatz im Suchindex

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author	Runyan, Walter R. 1925- Shaffner, Thomas J.
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classification_rvk	UP 2800 UP 3100
ctrlnum	(OCoLC)37246897 (DE-599)BVBBV011915218
dewey-full	621.3815/2/0287
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.3815/2/0287
dewey-search	621.3815/2/0287
dewey-sort	3621.3815 12 3287
dewey-tens	620 - Engineering and allied operations
discipline	Physik Elektrotechnik / Elektronik / Nachrichtentechnik
edition	2. ed.
format	Book
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indexdate	2024-12-20T10:21:02Z
institution	BVB
isbn	0070576971
language	English
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physical	X, 454 S. Ill., graph. Darst.
publishDate	1998
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publisher	McGraw-Hill
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spelling	Runyan, Walter R. 1925- Verfasser (DE-588)140968016 aut Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner 2. ed. New York [u.a.] McGraw-Hill 1998 X, 454 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Physical measurements Semiconductors Mikroskopie (DE-588)4039238-7 gnd rswk-swf Halbleitermesstechnik (DE-588)4158807-1 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf 1\p (DE-588)4151278-9 Einführung gnd-content Halbleitermesstechnik (DE-588)4158807-1 s DE-604 Halbleiter (DE-588)4022993-2 s Mikroskopie (DE-588)4039238-7 s Kristallographie (DE-588)4033217-2 s Shaffner, Thomas J. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Runyan, Walter R. 1925- Shaffner, Thomas J. Semiconductor measurements and instrumentation Physical measurements Semiconductors Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd Kristallographie (DE-588)4033217-2 gnd Halbleiter (DE-588)4022993-2 gnd
subject_GND	(DE-588)4039238-7 (DE-588)4158807-1 (DE-588)4033217-2 (DE-588)4022993-2 (DE-588)4151278-9
title	Semiconductor measurements and instrumentation
title_auth	Semiconductor measurements and instrumentation
title_exact_search	Semiconductor measurements and instrumentation
title_full	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_fullStr	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_full_unstemmed	Semiconductor measurements and instrumentation W. R. Runyan and T. J. Shaffner
title_short	Semiconductor measurements and instrumentation
title_sort	semiconductor measurements and instrumentation
topic	Physical measurements Semiconductors Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd Kristallographie (DE-588)4033217-2 gnd Halbleiter (DE-588)4022993-2 gnd
topic_facet	Physical measurements Semiconductors Mikroskopie Halbleitermesstechnik Kristallographie Halbleiter Einführung
work_keys_str_mv	AT runyanwalterr semiconductormeasurementsandinstrumentation AT shaffnerthomasj semiconductormeasurementsandinstrumentation

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MARC

Datensatz im Suchindex

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