On minimizing the number of test points needed to achieve complete robust path delay fault testability:
Gespeichert in:
| Beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Saarbrücken [u.a.]
Sonderforschungsbereich 124
1995
|
| Schriftenreihe: | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht
1995,8 |
| Umfang: | 18 Bl. graph. Darst. |
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| 245 | 1 | 0 | |a On minimizing the number of test points needed to achieve complete robust path delay fault testability |c P. Uppaluri ; U. Sparmann ; I. Pomeranz |
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Datensatz im Suchindex
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| id | DE-604.BV011020581 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T10:04:56Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007377849 |
| oclc_num | 258534630 |
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| physical | 18 Bl. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
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| publisher | Sonderforschungsbereich 124 |
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| series | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| series2 | Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| spellingShingle | Uppaluri, P. Sparmann, U. Pomeranz, I. On minimizing the number of test points needed to achieve complete robust path delay fault testability Sonderforschungsbereich VLSI-Entwurfsmethoden und Parallelität <Saarbrücken; Kaiserslautern>: SFB-Bericht |
| title | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_auth | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_exact_search | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_full | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_fullStr | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_full_unstemmed | On minimizing the number of test points needed to achieve complete robust path delay fault testability P. Uppaluri ; U. Sparmann ; I. Pomeranz |
| title_short | On minimizing the number of test points needed to achieve complete robust path delay fault testability |
| title_sort | on minimizing the number of test points needed to achieve complete robust path delay fault testability |
| volume_link | (DE-604)BV006185478 |
| work_keys_str_mv | AT uppalurip onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability AT sparmannu onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability AT pomeranzi onminimizingthenumberoftestpointsneededtoachievecompleterobustpathdelayfaulttestability |
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0834 CD.349 Lageplan |
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