Semiconductor measurements and instrumentation:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Nichtbestimmte Sprache |
| Veröffentlicht: |
Düsseldorf [u.a.]
McGraw-Hill
1975
|
| Schriftenreihe: | Texas instruments electronics series
International student edition |
| Schlagwörter: | |
| Umfang: | VII, 280 S. Ill., graph. Darst. |
| ISBN: | 0070542732 |
Internformat
MARC
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| 008 | 940227s1975 xx ad|| |||| 00||| und d | ||
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| 041 | |a und | ||
| 049 | |a DE-29T |a DE-706 | ||
| 084 | |a UP 2800 |0 (DE-625)146366: |2 rvk | ||
| 100 | 1 | |a Runyan, Walter R. |d 1925- |e Verfasser |0 (DE-588)140968016 |4 aut | |
| 245 | 1 | 0 | |a Semiconductor measurements and instrumentation |c W. R. Runyan |
| 264 | 1 | |a Düsseldorf [u.a.] |b McGraw-Hill |c 1975 | |
| 300 | |a VII, 280 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Texas instruments electronics series |v International student edition | |
| 650 | 0 | 7 | |a Halbleitermesstechnik |0 (DE-588)4158807-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristallographie |0 (DE-588)4033217-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroskopie |0 (DE-588)4039238-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4151278-9 |a Einführung |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleitermesstechnik |0 (DE-588)4158807-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | 1 | |a Mikroskopie |0 (DE-588)4039238-7 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 2 | 1 | |a Kristallographie |0 (DE-588)4033217-2 |D s |
| 689 | 2 | |5 DE-604 | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-006004247 | |
Datensatz im Suchindex
| _version_ | 1818951260877881344 |
|---|---|
| any_adam_object | |
| author | Runyan, Walter R. 1925- |
| author_GND | (DE-588)140968016 |
| author_facet | Runyan, Walter R. 1925- |
| author_role | aut |
| author_sort | Runyan, Walter R. 1925- |
| author_variant | w r r wr wrr |
| building | Verbundindex |
| bvnumber | BV009065854 |
| classification_rvk | UP 2800 |
| ctrlnum | (OCoLC)888583453 (DE-599)BVBBV009065854 |
| discipline | Physik |
| format | Book |
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| genre | 1\p (DE-588)4151278-9 Einführung gnd-content |
| genre_facet | Einführung |
| id | DE-604.BV009065854 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T09:31:40Z |
| institution | BVB |
| isbn | 0070542732 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006004247 |
| oclc_num | 888583453 |
| open_access_boolean | |
| owner | DE-29T DE-706 |
| owner_facet | DE-29T DE-706 |
| physical | VII, 280 S. Ill., graph. Darst. |
| publishDate | 1975 |
| publishDateSearch | 1975 |
| publishDateSort | 1975 |
| publisher | McGraw-Hill |
| record_format | marc |
| series2 | Texas instruments electronics series |
| spelling | Runyan, Walter R. 1925- Verfasser (DE-588)140968016 aut Semiconductor measurements and instrumentation W. R. Runyan Düsseldorf [u.a.] McGraw-Hill 1975 VII, 280 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Texas instruments electronics series International student edition Halbleitermesstechnik (DE-588)4158807-1 gnd rswk-swf Kristallographie (DE-588)4033217-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf 1\p (DE-588)4151278-9 Einführung gnd-content Halbleitermesstechnik (DE-588)4158807-1 s DE-604 Halbleiter (DE-588)4022993-2 s Mikroskopie (DE-588)4039238-7 s Kristallographie (DE-588)4033217-2 s 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Runyan, Walter R. 1925- Semiconductor measurements and instrumentation Halbleitermesstechnik (DE-588)4158807-1 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4158807-1 (DE-588)4033217-2 (DE-588)4039238-7 (DE-588)4022993-2 (DE-588)4151278-9 |
| title | Semiconductor measurements and instrumentation |
| title_auth | Semiconductor measurements and instrumentation |
| title_exact_search | Semiconductor measurements and instrumentation |
| title_full | Semiconductor measurements and instrumentation W. R. Runyan |
| title_fullStr | Semiconductor measurements and instrumentation W. R. Runyan |
| title_full_unstemmed | Semiconductor measurements and instrumentation W. R. Runyan |
| title_short | Semiconductor measurements and instrumentation |
| title_sort | semiconductor measurements and instrumentation |
| topic | Halbleitermesstechnik (DE-588)4158807-1 gnd Kristallographie (DE-588)4033217-2 gnd Mikroskopie (DE-588)4039238-7 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Halbleitermesstechnik Kristallographie Mikroskopie Halbleiter Einführung |
| work_keys_str_mv | AT runyanwalterr semiconductormeasurementsandinstrumentation |