UW VLSI chip tester:
Gespeichert in:
| Beteilige Person: | |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Seattle, Wash.
1989
|
| Schriftenreihe: | University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report
89,12,1 |
| Schlagwörter: | |
| Umfang: | 20 S. |
Internformat
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| 100 | 1 | |a MacKenzie, Neil |e Verfasser |4 aut | |
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| 264 | 1 | |a Seattle, Wash. |c 1989 | |
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| 490 | 1 | |a University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report |v 89,12,1 | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 810 | 2 | |a Department of Computer Science: Technical report |t University of Washington <Seattle, Wash.> |v 89,12,1 |w (DE-604)BV008930431 |9 89,12,1 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-005905126 | |
Datensatz im Suchindex
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| author | MacKenzie, Neil |
| author_facet | MacKenzie, Neil |
| author_role | aut |
| author_sort | MacKenzie, Neil |
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| bvnumber | BV008949468 |
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| id | DE-604.BV008949468 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T09:29:19Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005905126 |
| oclc_num | 27664537 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 20 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| record_format | marc |
| series2 | University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report |
| spelling | MacKenzie, Neil Verfasser aut UW VLSI chip tester Neil McKenzie Seattle, Wash. 1989 20 S. txt rdacontent n rdamedia nc rdacarrier University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report 89,12,1 Integrated circuits Very large scale integration Testing Department of Computer Science: Technical report University of Washington <Seattle, Wash.> 89,12,1 (DE-604)BV008930431 89,12,1 |
| spellingShingle | MacKenzie, Neil UW VLSI chip tester Integrated circuits Very large scale integration Testing |
| title | UW VLSI chip tester |
| title_auth | UW VLSI chip tester |
| title_exact_search | UW VLSI chip tester |
| title_full | UW VLSI chip tester Neil McKenzie |
| title_fullStr | UW VLSI chip tester Neil McKenzie |
| title_full_unstemmed | UW VLSI chip tester Neil McKenzie |
| title_short | UW VLSI chip tester |
| title_sort | uw vlsi chip tester |
| topic | Integrated circuits Very large scale integration Testing |
| topic_facet | Integrated circuits Very large scale integration Testing |
| volume_link | (DE-604)BV008930431 |
| work_keys_str_mv | AT mackenzieneil uwvlsichiptester |