Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis
Gespeichert in:
| Beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
New York u.a.
Wiley
1989
|
| Schriftenreihe: | A Wiley-Interscience Publication
|
| Schlagwörter: | |
| Umfang: | Getr. Zählung |
| ISBN: | 0471519456 |
Internformat
MARC
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|---|---|---|---|
| 001 | BV007684967 | ||
| 003 | DE-604 | ||
| 005 | 19970520 | ||
| 007 | t| | ||
| 008 | 930421s1989 xx |||| 00||| eng d | ||
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| 100 | 1 | |a Wilson, Robert G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b a practical handbook for depth profiling and bulk impurity analysis |c R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| 264 | 1 | |a New York u.a. |b Wiley |c 1989 | |
| 300 | |a Getr. Zählung | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a A Wiley-Interscience Publication | |
| 650 | 4 | |a Secondary ion mass spectrometry | |
| 650 | 0 | 7 | |a Massenspektrometrie |0 (DE-588)4037882-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
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| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Stevie, Fred A. |e Verfasser |4 aut | |
| 700 | 1 | |a Magee, Charles W. |e Verfasser |4 aut | |
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-005042702 | |
Datensatz im Suchindex
| DE-BY-TUM_call_number | 0285 B.13.D.21 |
|---|---|
| DE-BY-TUM_katkey | 800723 |
| DE-BY-TUM_location | LSB |
| DE-BY-TUM_media_number | TEMP2872246 |
| _version_ | 1821930883521708032 |
| any_adam_object | |
| author | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
| author_facet | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
| author_role | aut aut aut |
| author_sort | Wilson, Robert G. |
| author_variant | r g w rg rgw f a s fa fas c w m cw cwm |
| building | Verbundindex |
| bvnumber | BV007684967 |
| callnumber-first | Q - Science |
| callnumber-label | QD96 |
| callnumber-raw | QD96.S43 |
| callnumber-search | QD96.S43 |
| callnumber-sort | QD 296 S43 |
| callnumber-subject | QD - Chemistry |
| classification_rvk | UM 2110 VG 9800 |
| classification_tum | PHY 115f |
| ctrlnum | (OCoLC)20168488 (DE-599)BVBBV007684967 |
| dewey-full | 543/.0873 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.0873 |
| dewey-search | 543/.0873 |
| dewey-sort | 3543 3873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV007684967 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T09:09:44Z |
| institution | BVB |
| isbn | 0471519456 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005042702 |
| oclc_num | 20168488 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29T DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-83 DE-11 |
| owner_facet | DE-355 DE-BY-UBR DE-29T DE-91G DE-BY-TUM DE-19 DE-BY-UBM DE-83 DE-11 |
| physical | Getr. Zählung |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience Publication |
| spellingShingle | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4037882-2 (DE-588)4077346-2 |
| title | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_auth | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_exact_search | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_full | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_fullStr | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_full_unstemmed | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_sub | a practical handbook for depth profiling and bulk impurity analysis |
| topic | Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Secondary ion mass spectrometry Massenspektrometrie Sekundärionen-Massenspektrometrie |
| work_keys_str_mv | AT wilsonrobertg secondaryionmassspectrometryapracticalhandbookfordepthprofilingandbulkimpurityanalysis AT steviefreda secondaryionmassspectrometryapracticalhandbookfordepthprofilingandbulkimpurityanalysis AT mageecharlesw secondaryionmassspectrometryapracticalhandbookfordepthprofilingandbulkimpurityanalysis |
Paper/Kapitel scannen lassen
Handapparate (nicht verfügbar)
| Signatur: |
0285 B.13.D.21 Lageplan |
|---|---|
| Exemplar 1 | Dauerhaft ausgeliehen Ausgeliehen |