Defect recognition and image processing in III-V compounds: 2 Proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II) : Monterey, Calif., April 27 - 29, 1987
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere beteiligte Personen: | |
| Format: | Tagungsbericht Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Amsterdam u.a.
Elsevier
1987
|
| Schriftenreihe: | Materials science monographs
44 |
| Schlagwörter: | |
| Umfang: | X, 320 S. Ill., graph. Darst. |
| ISBN: | 0444428925 |
Internformat
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| author_sort | International Symposium on Defect Recognition and Image Processing in III-V Compounds Monterey, Calif |
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| id | DE-604.BV002402009 |
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| indexdate | 2024-12-20T07:50:08Z |
| institution | BVB |
| institution_GND | (DE-588)5040028-9 (DE-588)371117-1 |
| isbn | 0444428925 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001560091 |
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| owner_facet | DE-91G DE-BY-TUM DE-91 DE-BY-TUM DE-11 |
| physical | X, 320 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Elsevier |
| record_format | marc |
| series | Materials science monographs |
| series2 | Materials science monographs |
| spellingShingle | Defect recognition and image processing in III-V compounds Materials science monographs Fehlererkennung (DE-588)4133764-5 gnd Physikalische Eigenschaft (DE-588)4134738-9 gnd Konferenz (DE-588)4032055-8 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd Struktur (DE-588)4058125-1 gnd |
| subject_GND | (DE-588)4133764-5 (DE-588)4134738-9 (DE-588)4032055-8 (DE-588)4150649-2 (DE-588)4022993-2 (DE-588)4125030-8 (DE-588)4058125-1 |
| title | Defect recognition and image processing in III-V compounds |
| title_auth | Defect recognition and image processing in III-V compounds |
| title_exact_search | Defect recognition and image processing in III-V compounds |
| title_full | Defect recognition and image processing in III-V compounds 2 Proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II) : Monterey, Calif., April 27 - 29, 1987 ed. by Eicke R. Weber |
| title_fullStr | Defect recognition and image processing in III-V compounds 2 Proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II) : Monterey, Calif., April 27 - 29, 1987 ed. by Eicke R. Weber |
| title_full_unstemmed | Defect recognition and image processing in III-V compounds 2 Proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II) : Monterey, Calif., April 27 - 29, 1987 ed. by Eicke R. Weber |
| title_short | Defect recognition and image processing in III-V compounds |
| title_sort | defect recognition and image processing in iii v compounds proceedings of the second international symposium on defect recognition and image processing in iii v compounds drip ii monterey calif april 27 29 1987 |
| topic | Fehlererkennung (DE-588)4133764-5 gnd Physikalische Eigenschaft (DE-588)4134738-9 gnd Konferenz (DE-588)4032055-8 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd Halbleiter (DE-588)4022993-2 gnd Gitterbaufehler (DE-588)4125030-8 gnd Struktur (DE-588)4058125-1 gnd |
| topic_facet | Fehlererkennung Physikalische Eigenschaft Konferenz Drei-Fünf-Halbleiter Halbleiter Gitterbaufehler Struktur |
| volume_link | (DE-604)BV002394479 (DE-604)BV000008462 |
| work_keys_str_mv | AT internationalsymposiumondefectrecognitionandimageprocessinginiiivcompoundsmontereycalif defectrecognitionandimageprocessinginiiivcompounds2 AT webereicke defectrecognitionandimageprocessinginiiivcompounds2 AT internationalsymposiumondefectrecognitionandimageprocessinginiiivcompounds defectrecognitionandimageprocessinginiiivcompounds2 |
Paper/Kapitel scannen lassen
Bibliotheksmagazin
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0001 86 A 574-2
Lageplan 0701 0013 A 879 Lageplan |
|---|---|
| Exemplar 1 | Ausleihbar Am Standort |
| Exemplar 1 | Ausleihbar Am Standort |