Verfügbarkeit: Semiconductor measurements and instrumentation

Semiconductor measurements and instrumentation:

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Bibliographische Detailangaben
Beteilige Person:	Runyan, Walter R. 1925- (VerfasserIn)
Format:	Buch
Sprache:	Nichtbestimmte Sprache
Veröffentlicht:	New York MacGraw-Hill 1975
Schriftenreihe:	Texas instruments electronics series.
Schlagwörter:	Mikroskopie Halbleitermesstechnik Halbleiter Kristallographie Einführung
Umfang:	VII, 274 S.: Ill., graph.Darst., Tab.

Internformat

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Datensatz im Suchindex

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genre	(DE-588)4151278-9 Einführung gnd-content
genre_facet	Einführung
id	DE-604.BV002244711
illustrated	Not Illustrated
indexdate	2024-12-20T07:48:14Z
institution	BVB
language	Undetermined
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-001475187
oclc_num	630180643
open_access_boolean
owner	DE-91 DE-BY-TUM DE-83
owner_facet	DE-91 DE-BY-TUM DE-83
physical	VII, 274 S.: Ill., graph.Darst., Tab.
psigel	TUB-nvmb
publishDate	1975
publishDateSearch	1975
publishDateSort	1975
publisher	MacGraw-Hill
record_format	marc
series2	Texas instruments electronics series.
spellingShingle	Runyan, Walter R. 1925- Semiconductor measurements and instrumentation Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd
subject_GND	(DE-588)4039238-7 (DE-588)4158807-1 (DE-588)4022993-2 (DE-588)4033217-2 (DE-588)4151278-9
title	Semiconductor measurements and instrumentation
title_auth	Semiconductor measurements and instrumentation
title_exact_search	Semiconductor measurements and instrumentation
title_full	Semiconductor measurements and instrumentation
title_fullStr	Semiconductor measurements and instrumentation
title_full_unstemmed	Semiconductor measurements and instrumentation
title_short	Semiconductor measurements and instrumentation
title_sort	semiconductor measurements and instrumentation
topic	Mikroskopie (DE-588)4039238-7 gnd Halbleitermesstechnik (DE-588)4158807-1 gnd Halbleiter (DE-588)4022993-2 gnd Kristallographie (DE-588)4033217-2 gnd
topic_facet	Mikroskopie Halbleitermesstechnik Halbleiter Kristallographie Einführung
work_keys_str_mv	AT runyanwalterr semiconductormeasurementsandinstrumentation

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