Applications and metrology at nanometer scale: 1: Smart materials, electromagnetic waves and uncertainties
To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanic...
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| Beteilige Person: | |
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| Weitere beteiligte Personen: | , |
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
London Hoboken
ISTE Ltd. ;
2021
London Hoboken Wiley 2021 |
| Schriftenreihe: | Mechanical engineering and solid mechanics series
Reliability of multiphysical systems set v. 9 |
| Schlagwörter: | |
| Links: | https://learning.oreilly.com/library/view/-/9781786306401/?ar |
| Zusammenfassung: | To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master's students. |
| Beschreibung: | Includes bibliographical references and index |
| Umfang: | 1 Online-Ressource |
| ISBN: | 9781119808244 1119808243 9781119808220 1119808227 9781786306401 |
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| series2 | Mechanical engineering and solid mechanics series Reliability of multiphysical systems set |
| spelling | Dahoo, Pierre Richard VerfasserIn aut Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami London Hoboken ISTE Ltd. ; 2021 London Hoboken Wiley 2021 1 Online-Ressource Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Mechanical engineering and solid mechanics series Reliability of multiphysical systems set v. 9 Includes bibliographical references and index To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master's students. Metrology Métrologie Pougnet, Philippe MitwirkendeR ctb El Hami, Abdelkhalak MitwirkendeR ctb 1786306409 Erscheint auch als Druck-Ausgabe 1786306409 |
| spellingShingle | Dahoo, Pierre Richard Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties Metrology Métrologie |
| title | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties |
| title_auth | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties |
| title_exact_search | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties |
| title_full | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_fullStr | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_full_unstemmed | Applications and metrology at nanometer scale 1: Smart materials, electromagnetic waves and uncertainties Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami |
| title_short | Applications and metrology at nanometer scale |
| title_sort | applications and metrology at nanometer scale 1 smart materials electromagnetic waves and uncertainties |
| title_sub | 1: Smart materials, electromagnetic waves and uncertainties |
| topic | Metrology Métrologie |
| topic_facet | Metrology Métrologie |
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