Malarvel, M., Nayak, S., Panda, S., Pattnaik, P., Muangnak, N., Pattnaik, P. K., . . . Nayak, S. R. (2020). Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications (1st edition.). Wiley-Scrivener.
Chicago-Zitierstil (17. Ausg.)Malarvel, Muthukumaran, Soumya Nayak, Surya Panda, Prasant Pattnaik, Nittaya Muangnak, Prasant Kumar Pattnaik, Sury Narayan Panda, und Soumya Ranjan Nayak. Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications. 1st edition. [Place of publication not identified]: Wiley-Scrivener, 2020.
MLA-Zitierstil (9. Ausg.)Malarvel, Muthukumaran, et al. Machine Vision Inspection Systems, Image Processing, Concepts, Methodologies, and Applications. 1st edition. Wiley-Scrivener, 2020.