Semiconductor x-ray detectors:
Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...
Gespeichert in:
| Beteiligte Personen: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Boca Raton, FL
CRC Press
[2014]
|
| Schriftenreihe: | Series in sensors
|
| Schlagwörter: | |
| Links: | https://learning.oreilly.com/library/view/-/9781466554016/?ar |
| Zusammenfassung: | Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SD. |
| Beschreibung: | Includes bibliographical references and index |
| Umfang: | 1 Online-Ressource text file, PDF |
| ISBN: | 9781466554016 1466554010 1466554002 9781466554009 1306124115 9781306124119 1138033855 9781138033856 |
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| spelling | Lowe, B. G. VerfasserIn aut Semiconductor x-ray detectors B.G. Lowe, R.A. Sareen Boca Raton, FL CRC Press [2014] ©20 ©2014 1 Online-Ressource text file, PDF Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Series in sensors Includes bibliographical references and index Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SD. Semiconductors X-rays X-Rays Semi-conducteurs Rayons X semiconductor x-ray (radiation) TECHNOLOGY & ENGINEERING ; Mechanical Sareen, R. A. VerfasserIn aut 9781466554009 Erscheint auch als Druck-Ausgabe 9781466554009 |
| spellingShingle | Lowe, B. G. Sareen, R. A. Semiconductor x-ray detectors Semiconductors X-rays X-Rays Semi-conducteurs Rayons X semiconductor x-ray (radiation) TECHNOLOGY & ENGINEERING ; Mechanical |
| title | Semiconductor x-ray detectors |
| title_auth | Semiconductor x-ray detectors |
| title_exact_search | Semiconductor x-ray detectors |
| title_full | Semiconductor x-ray detectors B.G. Lowe, R.A. Sareen |
| title_fullStr | Semiconductor x-ray detectors B.G. Lowe, R.A. Sareen |
| title_full_unstemmed | Semiconductor x-ray detectors B.G. Lowe, R.A. Sareen |
| title_short | Semiconductor x-ray detectors |
| title_sort | semiconductor x ray detectors |
| topic | Semiconductors X-rays X-Rays Semi-conducteurs Rayons X semiconductor x-ray (radiation) TECHNOLOGY & ENGINEERING ; Mechanical |
| topic_facet | Semiconductors X-rays X-Rays Semi-conducteurs Rayons X semiconductor x-ray (radiation) TECHNOLOGY & ENGINEERING ; Mechanical |
| work_keys_str_mv | AT lowebg semiconductorxraydetectors AT sareenra semiconductorxraydetectors |