Testing for small-delay defects in nanoscale CMOS integrated circuits:
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
Gespeichert in:
| Weitere beteiligte Personen: | , |
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| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Boca Raton
CRC Press, Taylor & Francis Group
[2014]
|
| Schriftenreihe: | Devices, circuits, and systems
|
| Schlagwörter: | |
| Links: | https://learning.oreilly.com/library/view/-/9781439829417/?ar |
| Zusammenfassung: | Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay. |
| Beschreibung: | Includes bibliographical references and index. - Print version record |
| Umfang: | 1 Online-Ressource (xv, 247 Seiten) illustrations |
| ISBN: | 9781439829424 143982942X 1315217813 9781315217819 9781439829417 |
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| 546 | |a English. | ||
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| id | ZDB-30-ORH-047578467 |
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| isbn | 9781439829424 143982942X 1315217813 9781315217819 9781439829417 |
| language | English |
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| publishDate | 2014 |
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| publisher | CRC Press, Taylor & Francis Group |
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| series2 | Devices, circuits, and systems |
| spelling | Testing for small-delay defects in nanoscale CMOS integrated circuits edited by Sandeep K. Goel, Krishnendu Chakrabarty Boca Raton CRC Press, Taylor & Francis Group [2014] ©2014 1 Online-Ressource (xv, 247 Seiten) illustrations Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier Devices, circuits, and systems Includes bibliographical references and index. - Print version record Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay. English. Metal oxide semiconductors, Complementary Testing MOS complémentaires ; Essais TECHNOLOGY & ENGINEERING ; Mechanical Metal oxide semiconductors, Complementary ; Testing Goel, Sandeep K. HerausgeberIn edt Chakrabarty, Krishnendu HerausgeberIn edt 9781439829417 Erscheint auch als Druck-Ausgabe 9781439829417 |
| spellingShingle | Testing for small-delay defects in nanoscale CMOS integrated circuits Metal oxide semiconductors, Complementary Testing MOS complémentaires ; Essais TECHNOLOGY & ENGINEERING ; Mechanical Metal oxide semiconductors, Complementary ; Testing |
| title | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_auth | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_exact_search | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_full | Testing for small-delay defects in nanoscale CMOS integrated circuits edited by Sandeep K. Goel, Krishnendu Chakrabarty |
| title_fullStr | Testing for small-delay defects in nanoscale CMOS integrated circuits edited by Sandeep K. Goel, Krishnendu Chakrabarty |
| title_full_unstemmed | Testing for small-delay defects in nanoscale CMOS integrated circuits edited by Sandeep K. Goel, Krishnendu Chakrabarty |
| title_short | Testing for small-delay defects in nanoscale CMOS integrated circuits |
| title_sort | testing for small delay defects in nanoscale cmos integrated circuits |
| topic | Metal oxide semiconductors, Complementary Testing MOS complémentaires ; Essais TECHNOLOGY & ENGINEERING ; Mechanical Metal oxide semiconductors, Complementary ; Testing |
| topic_facet | Metal oxide semiconductors, Complementary Testing MOS complémentaires ; Essais TECHNOLOGY & ENGINEERING ; Mechanical Metal oxide semiconductors, Complementary ; Testing |
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