Pattern recognition introduction, features, classifiers and principles - Beyerer, Jürgen 1961-; Hagmanns, Raphael; Stadler, Daniel (De Gruyter Oldenbourg, 2024)
Keywords: Künstliche Intelligenz; Merkmalsextraktion; Data Mining; Automatische Klassifikation; Mustererkennung; Maschinelles Lernen; Automation; Artificial Intelligence; Auotmation; Machine Learning; TB: Textbook; Artificial Intelligence; Automation; Data Mining; Machine Learning; Artificial Intelligence; Data Mining; Auotmation; Machine Learning