APA (7th ed.) Citation

Beyerer, J., Hagmanns, R., & Stadler, D. (2024). Pattern recognition: Introduction, features, classifiers and principles (2nd Edition.). De Gruyter Oldenbourg.

Chicago Style (17th ed.) Citation

Beyerer, Jürgen, Raphael Hagmanns, and Daniel Stadler. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2nd Edition. Berlin ; Boston: De Gruyter Oldenbourg, 2024.

MLA (9th ed.) Citation

Beyerer, Jürgen, et al. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2nd Edition. De Gruyter Oldenbourg, 2024.

Warning: These citations may not always be 100% accurate.