Beyerer, J., Hagmanns, R., & Stadler, D. (2024). Pattern recognition: Introduction, features, classifiers and principles (2nd Edition.). De Gruyter Oldenbourg.
Chicago Style (17th ed.) CitationBeyerer, Jürgen, Raphael Hagmanns, and Daniel Stadler. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2nd Edition. Berlin ; Boston: De Gruyter Oldenbourg, 2024.
MLA (9th ed.) CitationBeyerer, Jürgen, et al. Pattern Recognition: Introduction, Features, Classifiers and Principles. 2nd Edition. De Gruyter Oldenbourg, 2024.
Warning: These citations may not always be 100% accurate.