Verfügbarkeit: Recent Advances in Metrology | Technische Universität München

Recent Advances in Metrology: Select Proceedings of AdMet 2022

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Weitere beteiligte Personen:	Yadav, Sanjay (HerausgeberIn), Garg, Naveen (HerausgeberIn), Aggarwal, Shankar G. (HerausgeberIn), Jaiswal, Shiv Kumar (HerausgeberIn), Kumar, Harish (HerausgeberIn), Achanta, Venu Gopal (HerausgeberIn)
Format:	Elektronisch E-Book
Sprache:	Englisch
Veröffentlicht:	Singapore Springer Nature Singapore 2024 Singapore Springer
Ausgabe:	1st ed. 2024
Schriftenreihe:	Lecture Notes in Mechanical Engineering
Schlagwörter:	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
Links:	https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8 https://doi.org/10.1007/978-981-99-4594-8
Umfang:	1 Online-Ressource (XIII, 221 p. 109 illus., 93 illus. in color)
ISBN:	9789819945948
ISSN:	2195-4364
DOI:	10.1007/978-981-99-4594-8

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spellingShingle	Recent Advances in Metrology Select Proceedings of AdMet 2022 Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
title	Recent Advances in Metrology Select Proceedings of AdMet 2022
title_auth	Recent Advances in Metrology Select Proceedings of AdMet 2022
title_exact_search	Recent Advances in Metrology Select Proceedings of AdMet 2022
title_full	Recent Advances in Metrology Select Proceedings of AdMet 2022 edited by Sanjay Yadav, Naveen Garg, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Harish Kumar, Venu Gopal Achanta
title_fullStr	Recent Advances in Metrology Select Proceedings of AdMet 2022 edited by Sanjay Yadav, Naveen Garg, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Harish Kumar, Venu Gopal Achanta
title_full_unstemmed	Recent Advances in Metrology Select Proceedings of AdMet 2022 edited by Sanjay Yadav, Naveen Garg, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Harish Kumar, Venu Gopal Achanta
title_short	Recent Advances in Metrology
title_sort	recent advances in metrology select proceedings of admet 2022
title_sub	Select Proceedings of AdMet 2022
topic	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
topic_facet	Electronics and Microelectronics, Instrumentation Quantum Measurement and Metrology Metrology and Fundamental Constants Electronics Quantum physics Atoms Metrology
url	https://doi.org/10.1007/978-981-99-4594-8
work_keys_str_mv	AT yadavsanjay recentadvancesinmetrologyselectproceedingsofadmet2022 AT gargnaveen recentadvancesinmetrologyselectproceedingsofadmet2022 AT aggarwalshankarg recentadvancesinmetrologyselectproceedingsofadmet2022 AT jaiswalshivkumar recentadvancesinmetrologyselectproceedingsofadmet2022 AT kumarharish recentadvancesinmetrologyselectproceedingsofadmet2022 AT achantavenugopal recentadvancesinmetrologyselectproceedingsofadmet2022

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