Technology assessment in a globalized world: facing the challenges of transnational technology governance
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Bibliographic Details
Other Authors: Hennen, Leonhard (Editor), Hahn, Julia (Editor), Ladikas, Miltos (Editor), Lindner, Ralf 1971- (Editor), Peissl, Walter 1959- (Editor), Est, Quirinus Cornelis van (Editor)
Format: Electronic eBook
Language:English
Published: Cham, Switzerland Springer [2023]
Subjects:
Links:https://doi.org/10.1007/978-3-031-10617-0
https://directory.doabooks.org/handle/20.500.12854/96258
Item Description:Open Access
Physical Description:1 Online-Ressource (xiii, 271 Seiten) Illustrationen
ISBN:9783031106170
DOI:10.1007/978-3-031-10617-0