Hennen, L., Hahn, J., Ladikas, M., Lindner, R., Peissl, W., & Est, Q. C. v. (2023). Technology assessment in a globalized world: Facing the challenges of transnational technology governance. Springer. https://doi.org/10.1007/978-3-031-10617-0
Chicago-Zitierstil (17. Ausg.)Hennen, Leonhard, Julia Hahn, Miltos Ladikas, Ralf Lindner, Walter Peissl, und Quirinus Cornelis van Est. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Cham, Switzerland: Springer, 2023. https://doi.org/10.1007/978-3-031-10617-0.
MLA-Zitierstil (9. Ausg.)Hennen, Leonhard, et al. Technology Assessment in a Globalized World: Facing the Challenges of Transnational Technology Governance. Springer, 2023. https://doi.org/10.1007/978-3-031-10617-0.