Removing the orientational degeneracy of the TS defect in 4H–SiC by electric fields and strain - Rühl, Maximilian; Lehmeyer, Johannes; Nagy, Roland; Weisser, Matthias; Bockstedte, Michel; Krieger, Michael; Weber, Heiko B. (Friedrich-Alexander-Universität Erlangen-Nürnberg, 2021)