Proceedings of the 2020 Joint Workshop of Fraunhofer IOSB and Institute for Anthropomatics, Vision and Fusion Laboratory - Beyerer, Jürgen 1961-; Zander, Tim 1977- (KIT Scientific Publishing, 2021)
Keywords: Metrologie; Künstliche Intelligenz; Maschinelles Lernen; Konferenzschrift -- 2020