Availability: Reliability and Risk Modeling of Engineering Systems

Reliability and Risk Modeling of Engineering Systems:

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Bibliographic Details
Other Authors:	Panchal, Dilbagh (Editor), Chatterjee, Prasenjit (Editor), Pamucar, Dragan (Editor), Tyagi, Mohit (Editor)
Format:	Electronic eBook
Language:	English
Published:	Cham Springer International Publishing 2021 Cham Springer
Edition:	1st ed. 2021
Series:	EAI/Springer Innovations in Communication and Computing
Subjects:	Communications Engineering, Networks System Performance and Evaluation Risk Management Operations Management Electrical engineering Computer system failures Risk management Production management
Links:	https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2 https://doi.org/10.1007/978-3-030-70151-2
Physical Description:	1 Online-Ressource (XIX, 165 p. 40 illus., 22 illus. in color)
ISBN:	9783030701512
ISSN:	2522-8595
DOI:	10.1007/978-3-030-70151-2

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MARC


LEADER	00000nam a2200000zcb4500
001	BV047316669
003	DE-604
005	00000000000000.0
007	cr\|uuu---uuuuu
008	210609s2021 xx o\|\|\|\| 00\|\|\| eng d
020			\|a 9783030701512 \|c Online \|9 978-3-030-70151-2
024	7		\|a 10.1007/978-3-030-70151-2 \|2 doi
035			\|a (ZDB-2-ENG)9783030701512
035			\|a (OCoLC)1256410925
035			\|a (DE-599)BVBBV047316669
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-859 \|a DE-860 \|a DE-91 \|a DE-858 \|a DE-1046 \|a DE-1043 \|a DE-Aug4 \|a DE-898 \|a DE-861 \|a DE-523 \|a DE-29 \|a DE-863 \|a DE-1050 \|a DE-862 \|a DE-92 \|a DE-573 \|a DE-M347 \|a DE-706 \|a DE-634
082	0		\|a 621.382 \|2 23
084			\|a MAS 000 \|2 stub
084			\|a ELT 000 \|2 stub
245	1	0	\|a Reliability and Risk Modeling of Engineering Systems \|c edited by Dilbagh Panchal, Prasenjit Chatterjee, Dragan Pamucar, Mohit Tyagi
250			\|a 1st ed. 2021
264		1	\|a Cham \|b Springer International Publishing \|c 2021
264		1	\|a Cham \|b Springer
300			\|a 1 Online-Ressource (XIX, 165 p. 40 illus., 22 illus. in color)
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	0		\|a EAI/Springer Innovations in Communication and Computing \|x 2522-8595
650		4	\|a Communications Engineering, Networks
650		4	\|a System Performance and Evaluation
650		4	\|a Risk Management
650		4	\|a Operations Management
650		4	\|a Electrical engineering
650		4	\|a Computer system failures
650		4	\|a Risk management
650		4	\|a Production management
700	1		\|a Panchal, Dilbagh \|4 edt
700	1		\|a Chatterjee, Prasenjit \|4 edt
700	1		\|a Pamucar, Dragan \|4 edt
700	1		\|a Tyagi, Mohit \|4 edt
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-030-70150-5
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-030-70152-9
776	0	8	\|i Erscheint auch als \|n Druck-Ausgabe \|z 978-3-030-70153-6
856	4	0	\|u https://doi.org/10.1007/978-3-030-70151-2 \|x Verlag \|z URL des Erstveröffentlichers \|3 Volltext
912			\|a ZDB-2-ENG
940	1		\|q ZDB-2-ENG_2021_Fremddaten
943	1		\|a oai:aleph.bib-bvb.de:BVB01-032719507
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-634 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-1043 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-1046 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-858 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-Aug4 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-1050 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-573 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-M347 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-92 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-898 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-859 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-860 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-861 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-863 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-862 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-523 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-91 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-706 \|p ZDB-2-ENG \|x Verlag \|3 Volltext
966	e		\|u https://doi.org/10.1007/978-3-030-70151-2 \|l DE-29 \|p ZDB-2-ENG \|x Verlag \|3 Volltext

Record in the Search Index

DE-BY-OTHR_katkey	6412713
DE-BY-TUM_katkey	2559557
_version_	1831257503369789441
any_adam_object
author2	Panchal, Dilbagh Chatterjee, Prasenjit Pamucar, Dragan Tyagi, Mohit
author2_role	edt edt edt edt
author2_variant	d p dp p c pc d p dp m t mt
author_facet	Panchal, Dilbagh Chatterjee, Prasenjit Pamucar, Dragan Tyagi, Mohit
building	Verbundindex
bvnumber	BV047316669
classification_tum	MAS 000 ELT 000
collection	ZDB-2-ENG
ctrlnum	(ZDB-2-ENG)9783030701512 (OCoLC)1256410925 (DE-599)BVBBV047316669
dewey-full	621.382
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	621 - Applied physics
dewey-raw	621.382
dewey-search	621.382
dewey-sort	3621.382
dewey-tens	620 - Engineering and allied operations
discipline	Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik
doi_str_mv	10.1007/978-3-030-70151-2
edition	1st ed. 2021
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03945nam a2200781zcb4500</leader><controlfield tag="001">BV047316669</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">210609s2021 xx o\|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030701512</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-030-70151-2</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-030-70151-2</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783030701512</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1256410925</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047316669</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-859</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.382</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability and Risk Modeling of Engineering Systems</subfield><subfield code="c">edited by Dilbagh Panchal, Prasenjit Chatterjee, Dragan Pamucar, Mohit Tyagi</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2021</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2021</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIX, 165 p. 40 illus., 22 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">EAI/Springer Innovations in Communication and Computing</subfield><subfield code="x">2522-8595</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Communications Engineering, Networks</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">System Performance and Evaluation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Risk Management</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Operations Management</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer system failures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Risk management</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Production management</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Panchal, Dilbagh</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chatterjee, Prasenjit</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pamucar, Dragan</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tyagi, Mohit</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-70150-5</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-70152-9</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-70153-6</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2021_Fremddaten</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032719507</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-858</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-M347</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-861</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-523</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-70151-2</subfield><subfield code="l">DE-29</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection>
id	DE-604.BV047316669
illustrated	Not Illustrated
indexdate	2024-12-20T19:16:01Z
institution	BVB
isbn	9783030701512
issn	2522-8595
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-032719507
oclc_num	1256410925
open_access_boolean
owner	DE-859 DE-860 DE-91 DE-BY-TUM DE-858 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634
owner_facet	DE-859 DE-860 DE-91 DE-BY-TUM DE-858 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634
physical	1 Online-Ressource (XIX, 165 p. 40 illus., 22 illus. in color)
psigel	ZDB-2-ENG ZDB-2-ENG_2021_Fremddaten
publishDate	2021
publishDateSearch	2021
publishDateSort	2021
publisher	Springer International Publishing Springer
record_format	marc
series2	EAI/Springer Innovations in Communication and Computing
spellingShingle	Reliability and Risk Modeling of Engineering Systems Communications Engineering, Networks System Performance and Evaluation Risk Management Operations Management Electrical engineering Computer system failures Risk management Production management
title	Reliability and Risk Modeling of Engineering Systems
title_auth	Reliability and Risk Modeling of Engineering Systems
title_exact_search	Reliability and Risk Modeling of Engineering Systems
title_full	Reliability and Risk Modeling of Engineering Systems edited by Dilbagh Panchal, Prasenjit Chatterjee, Dragan Pamucar, Mohit Tyagi
title_fullStr	Reliability and Risk Modeling of Engineering Systems edited by Dilbagh Panchal, Prasenjit Chatterjee, Dragan Pamucar, Mohit Tyagi
title_full_unstemmed	Reliability and Risk Modeling of Engineering Systems edited by Dilbagh Panchal, Prasenjit Chatterjee, Dragan Pamucar, Mohit Tyagi
title_short	Reliability and Risk Modeling of Engineering Systems
title_sort	reliability and risk modeling of engineering systems
topic	Communications Engineering, Networks System Performance and Evaluation Risk Management Operations Management Electrical engineering Computer system failures Risk management Production management
topic_facet	Communications Engineering, Networks System Performance and Evaluation Risk Management Operations Management Electrical engineering Computer system failures Risk management Production management
url	https://doi.org/10.1007/978-3-030-70151-2
work_keys_str_mv	AT panchaldilbagh reliabilityandriskmodelingofengineeringsystems AT chatterjeeprasenjit reliabilityandriskmodelingofengineeringsystems AT pamucardragan reliabilityandriskmodelingofengineeringsystems AT tyagimohit reliabilityandriskmodelingofengineeringsystems

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