Structural, syntactic, and statistical pattern recognition: joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021 : proceedings
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Bibliographic Details
Corporate Author: S+SSPR Online (Author)
Other Authors: Torsello, Andrea (Editor), Rossi, Luca 1980- (Editor), Pelillo, Marcello 1966- (Editor), Biggio, Battista (Editor), Robles-Kelly, Antonio (Editor)
Format: Electronic Conference Proceedings eBook
Language:English
Published: Cham, Switzerland Springer [2021]
Series:Image processing, computer vision, pattern recognition, and graphics 12644
Subjects:
Links:https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
https://doi.org/10.1007/978-3-030-73973-7
Physical Description:1 Online-Ressource Illustrationen, Diagramme
ISBN:9783030739737
DOI:10.1007/978-3-030-73973-7