Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
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| Main Authors: | , , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer International Publishing
2018
Cham Springer |
| Edition: | 3rd ed. 2018 |
| Series: | Springer Series in Advanced Microelectronics
10 |
| Subjects: | |
| Links: | https://doi.org/10.1007/978-3-319-99825-1 https://doi.org/10.1007/978-3-319-99825-1 https://doi.org/10.1007/978-3-319-99825-1 https://doi.org/10.1007/978-3-319-99825-1 https://doi.org/10.1007/978-3-319-99825-1 |
| Physical Description: | 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) |
| ISBN: | 9783319998251 |
| ISSN: | 1437-0387 |
| DOI: | 10.1007/978-3-319-99825-1 |
Staff View
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Record in the Search Index
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| author | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
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| id | DE-604.BV045913033 |
| illustrated | Not Illustrated |
| indexdate | 2024-12-20T18:38:19Z |
| institution | BVB |
| isbn | 9783319998251 |
| issn | 1437-0387 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031295569 |
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| physical | 1 Online-Ressource (XXI, 321 p. 126 illus., 68 illus. in color) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2018_Fremddaten |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| series2 | Springer Series in Advanced Microelectronics |
| spellingShingle | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie (DE-588)4242353-3 gnd Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| subject_GND | (DE-588)4242353-3 (DE-588)4047610-8 (DE-588)4014360-0 |
| title | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_auth | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_exact_search | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials |
| title_full | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_fullStr | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_full_unstemmed | Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert |
| title_short | Lock-in Thermography |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| title_sub | Basics and Use for Evaluating Electronic Devices and Materials |
| topic | Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie (DE-588)4242353-3 gnd Prüftechnik (DE-588)4047610-8 gnd Elektronisches Bauelement (DE-588)4014360-0 gnd |
| topic_facet | Optics, Lasers, Photonics, Optical Devices Characterization and Evaluation of Materials Microwaves, RF and Optical Engineering Structural Materials Surfaces (Physics) Microwaves Materials Infrarotthermographie Prüftechnik Elektronisches Bauelement |
| url | https://doi.org/10.1007/978-3-319-99825-1 |
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