Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials - Breitenstein, Otwin; Warta, Wilhelm; Schubert, Martin C. (Springer International Publishing, 2018)
Keywords: Optics, Lasers, Photonics, Optical Devices; Characterization and Evaluation of Materials; Microwaves, RF and Optical Engineering; Structural Materials; Surfaces (Physics); Microwaves; Materials; Infrarotthermographie; Prüftechnik; Elektronisches Bauelement