Lock-in thermography: basics and use for evaluating electronic devices and materials
Gespeichert in:
| Beteiligte Personen: | , , |
|---|---|
| Format: | Buch |
| Sprache: | Englisch |
| Veröffentlicht: |
Cham
Springer
[2018]
|
| Ausgabe: | third edition |
| Schriftenreihe: | Springer series in advanced microelectronics
10 |
| Schlagwörter: | |
| Umfang: | XXI, 321 Seiten Illustrationen, Diagramme |
| ISBN: | 9783319998244 |
Internformat
MARC
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| 035 | |a (OCoLC)1083872409 | ||
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| 245 | 1 | 0 | |a Lock-in thermography |b basics and use for evaluating electronic devices and materials |c Otwin Breitenstein ; Wilhelm Warta ; Martin C. Schubert |
| 250 | |a third edition | ||
| 264 | 1 | |a Cham |b Springer |c [2018] | |
| 300 | |a XXI, 321 Seiten |b Illustrationen, Diagramme | ||
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Datensatz im Suchindex
| _version_ | 1818984948763197440 |
|---|---|
| any_adam_object | |
| author | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin |
| author_GND | (DE-588)135966396 |
| author_facet | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin |
| author_role | aut aut aut |
| author_sort | Breitenstein, Otwin |
| author_variant | o b ob w w ww m s ms |
| building | Verbundindex |
| bvnumber | BV045434632 |
| classification_rvk | ZM 3700 ZN 4032 ZQ 3820 |
| classification_tum | MSR 360f MSR 415f |
| ctrlnum | (OCoLC)1083872409 (DE-599)BVBBV045434632 |
| dewey-full | 621.362 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.362 |
| dewey-search | 621.362 |
| dewey-sort | 3621.362 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik / Elektronik / Nachrichtentechnik Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| edition | third edition |
| format | Book |
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| id | DE-604.BV045434632 |
| illustrated | Illustrated |
| indexdate | 2024-12-20T18:27:07Z |
| institution | BVB |
| isbn | 9783319998244 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030820269 |
| oclc_num | 1083872409 |
| open_access_boolean | |
| owner | DE-29T DE-473 DE-BY-UBG |
| owner_facet | DE-29T DE-473 DE-BY-UBG |
| physical | XXI, 321 Seiten Illustrationen, Diagramme |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| series | Springer series in advanced microelectronics |
| series2 | Springer series in advanced microelectronics |
| spelling | Breitenstein, Otwin Verfasser aut Lock-in thermography basics and use for evaluating electronic devices and materials Otwin Breitenstein ; Wilhelm Warta ; Martin C. Schubert third edition Cham Springer [2018] XXI, 321 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Springer series in advanced microelectronics 10 Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 gnd rswk-swf Infrarotthermographie (DE-588)4242353-3 s DE-604 Elektronisches Bauelement (DE-588)4014360-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Warta, Wilhelm Verfasser aut Schubert, Martin Verfasser (DE-588)135966396 aut Erscheint auch als Online-Ausgabe, eBook 978-3-319-99825-1 Springer series in advanced microelectronics 10 (DE-604)BV012563021 10 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin Lock-in thermography basics and use for evaluating electronic devices and materials Springer series in advanced microelectronics Elektronisches Bauelement (DE-588)4014360-0 gnd Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd |
| subject_GND | (DE-588)4014360-0 (DE-588)4047610-8 (DE-588)4242353-3 |
| title | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_auth | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_exact_search | Lock-in thermography basics and use for evaluating electronic devices and materials |
| title_full | Lock-in thermography basics and use for evaluating electronic devices and materials Otwin Breitenstein ; Wilhelm Warta ; Martin C. Schubert |
| title_fullStr | Lock-in thermography basics and use for evaluating electronic devices and materials Otwin Breitenstein ; Wilhelm Warta ; Martin C. Schubert |
| title_full_unstemmed | Lock-in thermography basics and use for evaluating electronic devices and materials Otwin Breitenstein ; Wilhelm Warta ; Martin C. Schubert |
| title_short | Lock-in thermography |
| title_sort | lock in thermography basics and use for evaluating electronic devices and materials |
| title_sub | basics and use for evaluating electronic devices and materials |
| topic | Elektronisches Bauelement (DE-588)4014360-0 gnd Prüftechnik (DE-588)4047610-8 gnd Infrarotthermographie (DE-588)4242353-3 gnd |
| topic_facet | Elektronisches Bauelement Prüftechnik Infrarotthermographie |
| volume_link | (DE-604)BV012563021 |
| work_keys_str_mv | AT breitensteinotwin lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT wartawilhelm lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials AT schubertmartin lockinthermographybasicsanduseforevaluatingelectronicdevicesandmaterials |