Multi-Chip Module Test Strategies:
MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategi...
Gespeichert in:
| Weitere beteiligte Personen: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | Englisch |
| Veröffentlicht: |
Boston, MA
Springer US
1997
|
| Schriftenreihe: | Frontiers in Electronic Testing
7 |
| Schlagwörter: | |
| Links: | https://doi.org/10.1007/978-1-4615-6107-1 https://doi.org/10.1007/978-1-4615-6107-1 |
| Zusammenfassung: | MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2) |
| Umfang: | 1 Online-Ressource (167 p) |
| ISBN: | 9781461561071 |
| DOI: | 10.1007/978-1-4615-6107-1 |
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| isbn | 9781461561071 |
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| series2 | Frontiers in Electronic Testing |
| spelling | Multi-Chip Module Test Strategies edited by Yervant Zorian Boston, MA Springer US 1997 1 Online-Ressource (167 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 7 MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2) Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Zorian, Yervant edt Erscheint auch als Druck-Ausgabe 9781461377986 https://doi.org/10.1007/978-1-4615-6107-1 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Multi-Chip Module Test Strategies Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| title | Multi-Chip Module Test Strategies |
| title_auth | Multi-Chip Module Test Strategies |
| title_exact_search | Multi-Chip Module Test Strategies |
| title_full | Multi-Chip Module Test Strategies edited by Yervant Zorian |
| title_fullStr | Multi-Chip Module Test Strategies edited by Yervant Zorian |
| title_full_unstemmed | Multi-Chip Module Test Strategies edited by Yervant Zorian |
| title_short | Multi-Chip Module Test Strategies |
| title_sort | multi chip module test strategies |
| topic | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| url | https://doi.org/10.1007/978-1-4615-6107-1 |
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